Category:Micron Technology, Inc.
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Micron Technology, Inc., a global leader in memory and storage solutions, is known for its pioneering role in the semiconductor industry. Founded in 1978 and headquartered in Boise, Idaho, USA, Micron has grown into one of the largest memory manufacturers in the world.
Innovations and Key Technologies
Micron's core focus areas include the development and manufacturing of dynamic random-access memory (DRAM), NAND flash memory, and NOR flash memory. These technologies are critical components in a wide range of electronic devices, from computers and servers to mobile devices and automobiles.
- DRAM Products: Micron is a leading provider of DRAM products, crucial for high-speed data processing in computing devices.
- NAND Flash Memory: The company has made significant advancements in NAND technology, essential for data storage in a wide array of consumer electronics.
- Solid-State Drives (SSDs): Micron's SSDs, based on NAND technology, offer faster, more reliable storage solutions compared to traditional hard disk drives (HDDs).
- Emerging Memory Technologies: Micron is also involved in the development of next-generation memory technologies, like 3D XPoint, which offer higher performance and greater data density.
Patents and Research
Micron holds a substantial patent portfolio, emphasizing its commitment to innovation and R&D. These patents cover various aspects of semiconductor manufacturing, memory design, and data storage solutions. The company's research efforts aim to enhance memory performance, increase storage capacity, and reduce power consumption.
Lesser-Known Collaborations
Micron collaborates with a range of lesser-known companies and research institutions, focusing on advancing semiconductor technology and addressing the growing data demands of the future. These partnerships often target the development of more efficient, scalable, and sustainable memory solutions.
IPC Classifications
Micron's technologies correspond to several IPC classifications, indicating the company's broad innovation spectrum. Relevant IPC codes include:
- G11C (Static stores)
- H01L (Semiconductor devices; electric solid state devices not otherwise provided for)
- G06F (Electric digital data processing)
- G11B (Information storage based on relative movement between record carrier and transducer)
External Links and References
- [Micron Technology Official Website](https://www.micron.com/)
Categories
Pages in category "Micron Technology, Inc."
The following 200 pages are in this category, out of 740 total.
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- 17804826. DETERMINING LOCATIONS IN NAND MEMORY FOR BOOT-UP CODE simplified abstract (Micron Technology, Inc.)
- 17804997. SELF-ALIGNED ETCHING TECHNIQUES FOR MEMORY FORMATION simplified abstract (Micron Technology, Inc.)
- 17805009. METHODS OF FORMING MICROELECTRONIC DEVICES INCLUDING SUPPORT CONTACT STRUCTURES, AND RELATED MICROELECTRONIC DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17805090. MULTI-LEVEL CELLS, AND RELATED ARRAYS, DEVICES, SYSTEMS, AND METHODS simplified abstract (Micron Technology, Inc.)
- 17805167. MICROELECTRONIC DEVICES INCLUDING IMPLANT REGIONS, AND RELATED MEMORY DEVICES, ELECTRONIC SYSTEMS, AND METHODS simplified abstract (Micron Technology, Inc.)
- 17805201. MICROELECTRONIC DEVICES, RELATED ELECTRONIC SYSTEMS, AND METHODS OF FORMING MICROELECTRONIC DEVICES simplified abstract (Micron Technology, Inc.)
- 17805221. MICROELECTRONIC DEVICES, AND RELATED MEMORY DEVICES, ELECTRONIC SYSTEMS, AND METHODS simplified abstract (Micron Technology, Inc.)
- 17805586. MEMORY DEVICE ASSEMBLY WITH A LEAKER DEVICE simplified abstract (Micron Technology, Inc.)
- 17807303. MEMORY SECTION SELECTION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807307. REFRESH RATE SELECTION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807314. ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807813. EVALUATION OF MEMORY DEVICE HEALTH MONITORING LOGIC simplified abstract (Micron Technology, Inc.)
- 17808043. INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17809144. DYNAMIC ROW HAMMERING THRESHOLD FOR MEMORY simplified abstract (Micron Technology, Inc.)
- 17809731. PRIORITIZATION OF SUCCESSFUL READ RECOVERY OPERATIONS FOR A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17810952. DEVICE IDENTIFIER COMPOSITION ENGINE 3-LAYER ARCHITECTURE simplified abstract (Micron Technology, Inc.)
- 17811770. CLASSIFICATION AND MITIGATION OF COMPUTE EXPRESS LINK SECURITY THREATS simplified abstract (Micron Technology, Inc.)
- 17812141. MICROELECTRONIC DEVICES WITH CONTACTS EXTENDING THROUGH METAL OXIDE REGIONS OF STEP TREADS, AND RELATED SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 17812233. MEMORY DEVICE ASSEMBLY WITH REDISTRIBUTION LAYER BETWEEN TRANSISTORS AND CAPACITORS simplified abstract (Micron Technology, Inc.)
- 17813420. APPARATUSES INCLUDING SEMICONDUCTIVE PILLAR STRUCTURES, AND RELATED METHODS, MEMORY DEVICES, AND ELECTRONIC SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17814395. NAND PAGE BUFFER BASED SECURITY OPERATIONS simplified abstract (Micron Technology, Inc.)
- 17815098. SEMICONDUCTOR DEVICE HAVING SHIELD PATTERNS simplified abstract (Micron Technology, Inc.)
- 17815337. VARIABLE ROUTING CLAMP simplified abstract (Micron Technology, Inc.)
- 17815359. METHODS OF FORMING THE MICROELECTRONIC DEVICES, AND RELATED MICROELECTONIC DEVICES AND ELECTRONIC SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17815420. MEMORY DEVICE ASSEMBLY WITH NON-IMPINGED LEAKER DEVICES simplified abstract (Micron Technology, Inc.)
- 17815742. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MASK INVERSION BIT simplified abstract (Micron Technology, Inc.)
- 17815912. ENHANCED NEGATIVE ACKNOWLEDGMENT CONTROL FRAME simplified abstract (Micron Technology, Inc.)
- 17815915. ISOLATION REGIONS WITHIN A MEMORY DIE simplified abstract (Micron Technology, Inc.)
- 17815917. CONNECTION DESIGNS FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17816505. TECHNIQUES FOR CONCURRENTLY-FORMED CAVITIES IN THREE-DIMENSIONAL MEMORY ARRAYS simplified abstract (Micron Technology, Inc.)
- 17816628. ANTIFUSE, APPARATUS, AND METHOD OF FORMING THE SAME simplified abstract (Micron Technology, Inc.)
- 17816651. VERTICAL NON-VOLATILE MEMORY WITH LOW RESISTANCE SOURCE CONTACT simplified abstract (Micron Technology, Inc.)
- 17818613. CONFIGURABLE TYPES OF WRITE OPERATIONS simplified abstract (Micron Technology, Inc.)
- 17818617. RANDOM NUMBER GENERATION BASED ON THRESHOLD VOLTAGE RANDOMNESS simplified abstract (Micron Technology, Inc.)
- 17818920. TECHNIQUES FOR STORING JOURNALING INFORMATION simplified abstract (Micron Technology, Inc.)
- 17818922. COMMAND SEQUENCE TO SUPPORT ADAPTIVE MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17819538. ELECTRONIC DEVICES INCLUDING STACKS INCLUDING CONDUCTIVE STRUCTURES ISOLATED BY SLOT STRUCTURES, AND RELATED SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 17819567. MODEL FOR PREDICTING MEMORY SYSTEM PERFORMANCE simplified abstract (Micron Technology, Inc.)
- 17819569. PILLAR AND WORD LINE PLATE ARCHITECTURE FOR A MEMORY ARRAY simplified abstract (Micron Technology, Inc.)
- 17819575. MICROELECTRONIC DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMS, AND METHODS OF FORMING THE SAME simplified abstract (Micron Technology, Inc.)
- 17819826. DETECTING A MEMORY WRITE RELIABILITY RISK WITHOUT USING A WRITE VERIFY OPERATION simplified abstract (Micron Technology, Inc.)
- 17821645. STRUCTURES FOR WORD LINE MULTIPLEXING IN THREE-DIMENSIONAL MEMORY ARRAYS simplified abstract (Micron Technology, Inc.)
- 17821646. WORD LINE DRIVERS FOR MULTIPLE-DIE MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17821676. MEMORY WITH PARALLEL MAIN AND TEST INTERFACES simplified abstract (Micron Technology, Inc.)
- 17821740. Synchronous Input Buffer Control Using a State Machine simplified abstract (Micron Technology, Inc.)
- 17821775. SEMICONDUCTOR DEVICE HAVING SENSE AMPLIFIER EQUIPPED WITH COMPENSATION CIRCUIT simplified abstract (Micron Technology, Inc.)
- 17821871. HEAT SPREADER APPARATUS WITH MAGNETIC ATTACHMENTS ON PRINTED WIRING BOARD ASSEMBLIES, RELATED METHODS AND ELECTRONIC SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17821924. SINGLE-BIT ERROR INDICATION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17822032. SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17822101. MICROELECTRONIC DEVICES WITH A TIERED STACK OF CONDUCTIVE, INSULATIVE, AND PARTIALLY-SACRIFICIAL STRUCTURES, AND RELATED SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 17822250. MEMORY DEVICE LOG DATA STORAGE simplified abstract (Micron Technology, Inc.)
- 17822421. MICROELECTRONIC DEVICES INCLUDING STADIUM STRUCTURES, AND RELATED MEMORY DEVICES AND ELECTRONIC SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17822606. SELECTIVE DATA MAP UNIT ACCESS simplified abstract (Micron Technology, Inc.)
- 17822712. STAIRCASE FORMATION IN A MEMORY ARRAY simplified abstract (Micron Technology, Inc.)
- 17822726. MICROELECTRONIC DEVICES COMPRISING A BORON-CONTAINING MATERIAL, AND RELATED ELECTRONIC SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 17822893. READ OPERATIONS FOR MIXED DATA simplified abstract (Micron Technology, Inc.)
- 17822895. MEMORY DEVICE OPERATIONS FOR UNALIGNED WRITE OPERATIONS simplified abstract (Micron Technology, Inc.)
- 17822909. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17822912. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17822915. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17823162. SEMICONDUCTOR CONDUCTIVE PILLAR DEVICE AND METHOD simplified abstract (Micron Technology, Inc.)
- 17823189. DIE EDGE FILLET AND 3D-PRINTED CNT AS BENDING STRESS BUFFER simplified abstract (Micron Technology, Inc.)
- 17823191. PARTIAL BLOCK READ VOLTAGE OFFSET simplified abstract (Micron Technology, Inc.)
- 17823276. ELECTRONIC DEVICES COMPRISING BLOCKING REGIONS, AND RELATED ELECTRONIC SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 17823307. EVICTING A CACHE LINE WITH PENDING CONTROL REQUEST simplified abstract (Micron Technology, Inc.)
- 17823314. HOST-PREFERRED MEMORY OPERATION simplified abstract (Micron Technology, Inc.)
- 17823323. MEMORY SIDE CACHE REQUEST HANDLING simplified abstract (Micron Technology, Inc.)
- 17823349. MULTI-CHIP PACKAGE WITH ENHANCED CONDUCTIVE LAYER ADHESION simplified abstract (Micron Technology, Inc.)
- 17823365. BLOCK FAILURE PROTECTION FOR ZONE MEMORY SYSTEM simplified abstract (Micron Technology, Inc.)
- 17823371. TRANSISTOR CONFIGURATIONS FOR VERTICAL MEMORY ARRAYS simplified abstract (Micron Technology, Inc.)
- 17823391. MEMORY-SIDE CACHE DIRECTORY-BASED REQUEST QUEUE simplified abstract (Micron Technology, Inc.)
- 17823407. Adaptive Memory Registers simplified abstract (Micron Technology, Inc.)
- 17823408. SILENT CACHE LINE EVICTION simplified abstract (Micron Technology, Inc.)
- 17823415. Bus Training with Interconnected Dice simplified abstract (Micron Technology, Inc.)
- 17823423. Bus Training with Interconnected Dice simplified abstract (Micron Technology, Inc.)
- 17823432. Erroneous Select Die Access (SDA) Detection simplified abstract (Micron Technology, Inc.)
- 17823443. Asymmetric Read-Write Sequence for Interconnected Dies simplified abstract (Micron Technology, Inc.)
- 17823450. Dynamic Address Scramble simplified abstract (Micron Technology, Inc.)
- 17823458. Die Disablement simplified abstract (Micron Technology, Inc.)
- 17823462. METHOD OF SUBMITTING WORK TO FABRIC ATTACHED MEMORY simplified abstract (Micron Technology, Inc.)
- 17823468. QUEUEING ASYNCHRONOUS EVENTS FOR ACCEPTANCE BY THREADS EXECUTING IN A BARREL PROCESSOR simplified abstract (Micron Technology, Inc.)
- 17823469. Read Data Path simplified abstract (Micron Technology, Inc.)
- 17823470. METHOD OF EFFICIENTLY IDENTIFYING ROLLBACK REQUESTS simplified abstract (Micron Technology, Inc.)
- 17823472. METHODS OF FORMING MICROELECTRONIC DEVICES, AND RELATED MICROELECTRONIC DEVICES, MEMORY DEVICES, AND ELECTRONIC SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17823476. Read Data Path for a Memory System simplified abstract (Micron Technology, Inc.)
- 17823625. FILTERING METRICS ASSOCIATED WITH MEMORY simplified abstract (Micron Technology, Inc.)
- 17823728. RESOLVING MISPLACED ITEMS IN PHYSICAL RETAIL STORES simplified abstract (Micron Technology, Inc.)
- 17823734. THREE-DIMENSIONAL MODELS OF USERS WEARING CLOTHING ITEMS simplified abstract (Micron Technology, Inc.)
- 17823740. MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR simplified abstract (Micron Technology, Inc.)
- 17823745. NAVIGATION PATHS FOR DIRECTING USERS TO LOCATIONS WITHIN A PHYSICAL RETAIL STORE USING EXTENDED REALITY simplified abstract (Micron Technology, Inc.)
- 17823763. GENERATING SUGGESTIONS USING EXTENDED REALITY simplified abstract (Micron Technology, Inc.)
- 17823773. NAVIGATION PATHS FOR DIRECTING USERS TO FOOD ITEMS BASED ON MEAL PLANS simplified abstract (Micron Technology, Inc.)
- 17823806. MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING simplified abstract (Micron Technology, Inc.)
- 17823909. MEMORY WITH SWITCHABLE CHANNELS simplified abstract (Micron Technology, Inc.)
- 17829576. System And Method To Control Memory Error Detection With Automatic Disabling simplified abstract (Micron Technology, Inc.)
- 17829737. Pre-Sense Gut Node Amplification in Sense Amplifier simplified abstract (Micron Technology, Inc.)
- 17829913. EARLY STOPPING OF BIT-FLIP LOW DENSITY PARITY CHECK DECODING BASED ON SYNDROME WEIGHT simplified abstract (Micron Technology, Inc.)
- 17829920. POWER EFFICIENT CODEWORD SCRAMBLING IN A NON-VOLATILE MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17829924. SCALED BIT FLIP THRESHOLDS ACROSS COLUMNS FOR IRREGULAR LOW DENSITY PARITY CHECK DECODING simplified abstract (Micron Technology, Inc.)
- 17830013. DIELECTRIC ENGINEERED TUNNEL REGION IN MEMORY CELLS simplified abstract (Micron Technology, Inc.)
- 17830042. DECODER ARCHITECTURES FOR THREE-DIMENSIONAL MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17830047. CONTROLLING VARIATION OF VALID DATA COUNTS IN GARBAGE COLLECTION SOURCE BLOCKS simplified abstract (Micron Technology, Inc.)
- 17830100. SWITCH AND HOLD BIASING FOR MEMORY CELL IMPRINT RECOVERY simplified abstract (Micron Technology, Inc.)
- 17830108. Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells simplified abstract (Micron Technology, Inc.)
- 17830145. MEMORY CELL CAPACITOR STRUCTURES FOR THREE-DIMENSIONAL MEMORY ARRAYS simplified abstract (Micron Technology, Inc.)
- 17830166. MANAGING QUAD-LEVEL CELL COMPACTION STRATEGY OF A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17830169. TEST MODE STATE MACHINE FOR A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17830224. MODULAR CONSTRUCTION OF HYBRID-BONDED SEMICONDUCTOR DIE ASSEMBLIES AND RELATED SYSTEMS AND METHODS simplified abstract (Micron Technology, Inc.)
- 17830625. ADAPTIVE ENHANCED CORRECTIVE READ BASED ON WRITE AND READ TEMPERATURE simplified abstract (Micron Technology, Inc.)
- 17830780. AUTOMATED RENDERING OF DATA FLOW ARCHITECTURE FOR NETWORKED COMPUTER SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17830800. CROSS-TEMPERATURE COMPENSATION IN NON-VOLATILE MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17830802. DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17831086. MANAGING DATA INTEGRITY USING A CHANGE IN A NUMBER OF DATA ERRORS AND AN AMOUNT OF TIME IN WHICH THE CHANGE OCCURRED simplified abstract (Micron Technology, Inc.)
- 17831114. TRACKING THE EFFECTS OF VOLTAGE AND TEMPERATURE ON A MEMORY DEVICE USING AN INTERNAL OSCILLATOR simplified abstract (Micron Technology, Inc.)
- 17831242. ACCESS HEATMAP IMPLEMENTATIONS AT A HOST DEVICE simplified abstract (Micron Technology, Inc.)
- 17831251. SYNCHRONOUS INPUT BUFFER ENABLE FOR DFE OPERATION simplified abstract (Micron Technology, Inc.)
- 17831263. DATA PROTECTION FOR STACKS OF MEMORY DICE simplified abstract (Micron Technology, Inc.)
- 17831266. CELL VOLTAGE DROP COMPENSATION CIRCUIT simplified abstract (Micron Technology, Inc.)
- 17831270. ACCESS HEATMAP GENERATION AT A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17831290. PRE-DECODER CIRCUITY simplified abstract (Micron Technology, Inc.)
- 17831311. PRE-DECODER CIRCUITRY simplified abstract (Micron Technology, Inc.)
- 17831329. GLITCH DETECTION REDUNDANCY simplified abstract (Micron Technology, Inc.)
- 17831332. PRE-DECODER CIRCUITY simplified abstract (Micron Technology, Inc.)
- 17831344. FIFO MEMORY ERROR CONDITION DETECTION simplified abstract (Micron Technology, Inc.)
- 17831350. MEMORY BLOCK CHARACTERISTIC DETERMINATION simplified abstract (Micron Technology, Inc.)
- 17831353. METHODS TO SECURE ACCESS TO AN AUTOMOBILE AND AN AUTHENTICATED IGNITION SYSTEM simplified abstract (Micron Technology, Inc.)
- 17831364. ERROR REDUCTION DURING CRYPTOGRAPHIC KEY UPDATES IN SECURE MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17831368. ROBUST FUNCTIONALITY FOR MEMORY MANAGEMENT ASSOCIATED WITH HIGH-TEMPERATURE STORAGE AND OTHER CONDITIONS simplified abstract (Micron Technology, Inc.)
- 17831370. VERIFIED KEY REPLACEMENT IN SECURE MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17831414. INTERNAL REFERENCE RESISTOR FOR NON-VOLATILE MEMORY simplified abstract (Micron Technology, Inc.)
- 17831433. WRITE COMMAND EXECUTION FOR DATA PROTECTION AND RECOVERY SCHEMES simplified abstract (Micron Technology, Inc.)
- 17831436. MEMORY SUB-SYSTEM ADDRESSING FOR DATA AND ADDITIONAL DATA PORTIONS simplified abstract (Micron Technology, Inc.)
- 17832068. DATA PATH SEQUENCING IN MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17833371. DYNAMIC DECODING FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17833749. SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME simplified abstract (Micron Technology, Inc.)
- 17834414. Error Detection in Communications over Serial Peripheral Interfaces simplified abstract (Micron Technology, Inc.)
- 17834547. PROTECTION AGAINST INVALID MEMORY COMMANDS simplified abstract (Micron Technology, Inc.)
- 17834754. TIMING ADJUSTMENT FOR DATA INPUT/OUTPUT BUFFER CIRCUITS simplified abstract (Micron Technology, Inc.)
- 17842278. ERROR AVOIDANCE FOR PARTIALLY PROGRAMMED BLOCKS OF A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17848021. MEMORY DEVICE INCLUDING HIGH-ASPECT-RATIO CONDUCTIVE CONTACTS simplified abstract (Micron Technology, Inc.)
- 17851393. Memory Circuitry And Method Used In Forming Memory Circuitry simplified abstract (Micron Technology, Inc.)
- 17851865. Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory Cells simplified abstract (Micron Technology, Inc.)
- 17855483. FORWARD-LOOKING DETERMINATION OF READ VOLTAGE USING MEMORY CELL PATTERNS simplified abstract (Micron Technology, Inc.)
- 17856691. ADAPTIVE TEMPERATURE COMPENSATION FOR A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17856771. DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE simplified abstract (Micron Technology, Inc.)
- 17858560. ESTABLISHING A CHAIN OF OWNERSHIP OF A DEVICE simplified abstract (Micron Technology, Inc.)
- 17858568. PERFORMING SECURITY FUNCTIONS USING DEVICES HAVING EMBEDDED HARDWARE SECURITY MODULES simplified abstract (Micron Technology, Inc.)
- 17858731. ADAPTIVE WEAR LEVELING FOR ENDURANCE COMPENSATION simplified abstract (Micron Technology, Inc.)
- 17859045. VEHICLE COMMUNICATION AND NAVIGATION SYSTEMS FOR ROAD SAFETY simplified abstract (Micron Technology, Inc.)
- 17859468. MEMORY COMPACTION MANAGEMENT IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17859892. SECURING ELECTRONIC BALLOT SYSTEMS VIA SECURE MEMORY DEVICES WITH EMBEDDED HARDWARE SECURITY MODULES simplified abstract (Micron Technology, Inc.)
- 17860021. PATTERNING OF 3D NAND PILLARS AND FLYING BUTTRESS SUPPORTS WITH TWO STRIPE TECHNIQUE simplified abstract (Micron Technology, Inc.)
- 17860027. PATTERNING OF 3D NAND PILLARS AND FLYING BUTTRESS SUPPORTS WITH THREE STRIPE TECHNIQUE simplified abstract (Micron Technology, Inc.)
- 17860470. Sense Amplifier Reference Voltage Through Sense Amplifier Latch Devices simplified abstract (Micron Technology, Inc.)
- 17860690. MANAGING COMPENSATION FOR CHARGE COUPLING AND LATERAL MIGRATION IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17860701. MANAGING ERROR COMPENSATION USING CHARGE COUPLING AND LATERAL MIGRATION SENSITIVITY simplified abstract (Micron Technology, Inc.)
- 17860711. MANAGING PROGRAM VERIFY VOLTAGE OFFSETS FOR CHARGE COUPLING AND LATERAL MIGRATION COMPENSATION IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17862082. DIFFERENTIAL STROBE FAULT INDICATION simplified abstract (Micron Technology, Inc.)
- 17863000. MODIFIED READ COUNTER INCREMENTING SCHEME IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 17863317. SELECTIVE CAVITY MERGING FOR ISOLATION REGIONS IN A MEMORY DIE simplified abstract (Micron Technology, Inc.)
- 17864046. TIMING FOR OPERATIONS IN MEMORY DEVICE STORING BITS IN MEMORY CELL PAIRS simplified abstract (Micron Technology, Inc.)
- 17864192. PLANE BALANCING IN A MEMORY SYSTEM simplified abstract (Micron Technology, Inc.)
- 17865565. Memory Circuitry And Method Used In Forming Memory Circuitry simplified abstract (Micron Technology, Inc.)
- 17873869. VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME simplified abstract (Micron Technology, Inc.)
- 17873991. PERFORMING SENSE OPERATIONS IN MEMORY simplified abstract (Micron Technology, Inc.)
- 17874206. HYBRID SEMICONDUCTOR DEVICE ASSEMBLY INTERCONNECTION PILLARS AND ASSOCIATED METHODS simplified abstract (Micron Technology, Inc.)
- 17874828. RELIABILITY BASED DATA VERIFICATION simplified abstract (Micron Technology, Inc.)
- 17874867. VOLTAGE REGULATION SYSTEM simplified abstract (Micron Technology, Inc.)
- 17874952. HARDWARE RESET MANAGEMENT FOR UNIVERSAL FLASH STORAGE simplified abstract (Micron Technology, Inc.)
- 17875521. INCOMPLETE SUPERBLOCK MANAGEMENT FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17875778. SEMICONDUCTOR DEVICE ASSEMBLY INTERCONNECTION PILLARS AND ASSOCIATED METHODS simplified abstract (Micron Technology, Inc.)
- 17875827. APPARATUS WITH CIRCUIT MANAGEMENT MECHANISM AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.)
- 17876271. MEMORY DEVICE INCLUDING PREFORMED RECESSES BETWEEN CONTACT STRUCTURES AND CONTROL GATES simplified abstract (Micron Technology, Inc.)
- 17876326. LATERAL ETCH STOPS FOR ACCESS LINE FORMATION IN A MEMORY DIE simplified abstract (Micron Technology, Inc.)
- 17876346. MEMORY CELL VOLTAGE LEVEL SELECTION simplified abstract (Micron Technology, Inc.)
- 17876355. TEMPORAL METRIC DRIVEN MEDIA MANAGEMENT SCHEME simplified abstract (Micron Technology, Inc.)
- 17877240. WORDLINE LEAKAGE TEST MANAGEMENT simplified abstract (Micron Technology, Inc.)
- 17877296. MEMORY WITH PARTIAL ARRAY DENSITY SECURITY, AND ASSOCIATED SYSTEMS, DEVICES, AND METHODS simplified abstract (Micron Technology, Inc.)
- 17877532. MEASURING A TIMING MARGIN OF A MEMORY DEVICE USING AN INTERNAL OSCILLOSCOPE simplified abstract (Micron Technology, Inc.)
- 17877592. MEMORY ROW-HAMMER MITIGATION simplified abstract (Micron Technology, Inc.)
- 17877613. MEMORY CELL READ OPERATION TECHNIQUES simplified abstract (Micron Technology, Inc.)
- 17877637. ACCESSING DATA USING ERROR CORRECTION OPERATION(S) TO REDUCE LATENCY AT A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 17877779. MEMORY SYSTEM FAILURE DETECTION AND SELF RECOVERY OF MEMORY DICE simplified abstract (Micron Technology, Inc.)
- 17878236. METAL GATE STACKS FOR CMOS SCALING simplified abstract (Micron Technology, Inc.)
- 17883736. THICK GATE OXIDE TRANSISTOR DEVICE AND METHOD simplified abstract (Micron Technology, Inc.)
- 17883919. FINFETS WITH REDUCED PARASITICS simplified abstract (Micron Technology, Inc.)
- 17884076. ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17884107. MANAGING COMPENSATION FOR CELL-TO-CELL COUPLING AND LATERAL MIGRATION IN MEMORY DEVICES USING SEGMENTATION simplified abstract (Micron Technology, Inc.)
- 17884113. MANAGING COMPENSATION FOR CELL-TO-CELL COUPLING AND LATERAL MIGRATION IN MEMORY DEVICES BASED ON A SENSITIVITY METRIC simplified abstract (Micron Technology, Inc.)
- 17884261. SYSTEMS AND METHODS FOR CONTROLLING COMMON MODE LEVEL FOR SENSE AMPLIFIER CIRCUITRY simplified abstract (Micron Technology, Inc.)
- 17884278. TEMPERATURE-DEPENDENT REFRESH OPERATIONS simplified abstract (Micron Technology, Inc.)
- 17884299. MERGED CAVITIES AND BURIED ETCH STOPS FOR THREE-DIMENSIONAL MEMORY ARRAYS simplified abstract (Micron Technology, Inc.)
- 17884327. ADAPTIVE OPTIMIZATION OF ERROR-HANDLING FLOWS IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17884422. SEQUENTIAL WRITE OPERATIONS USING MULTIPLE MEMORY DIES simplified abstract (Micron Technology, Inc.)
- 17884429. SUSPENDING OPERATIONS OF A MEMORY SYSTEM simplified abstract (Micron Technology, Inc.)
- 17884432. MULTI-LAYER CODE RATE ARCHITECTURE FOR SPECIAL EVENT PROTECTION WITH REDUCED PERFORMANCE PENALTY simplified abstract (Micron Technology, Inc.)
- 17884441. RESUMING WRITE OPERATIONS AFTER SUSPENSION simplified abstract (Micron Technology, Inc.)
- 17884450. PROGRAMMABLE CHALCOGENIDE CAPACITORS simplified abstract (Micron Technology, Inc.)
- 17884468. SEMICONDUCTOR DEVICE INTERCONNECTS HAVING CONDUCTIVE ANNULUS-STABILIZED THROUGH-SILICON VIAS simplified abstract (Micron Technology, Inc.)
- 17884475. SUBSTRATE FOR VERTICALLY ASSEMBLED SEMICONDUCTOR DIES simplified abstract (Micron Technology, Inc.)
