17875827. APPARATUS WITH CIRCUIT MANAGEMENT MECHANISM AND METHODS FOR OPERATING THE SAME simplified abstract (Micron Technology, Inc.)

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APPARATUS WITH CIRCUIT MANAGEMENT MECHANISM AND METHODS FOR OPERATING THE SAME

Organization Name

Micron Technology, Inc.

Inventor(s)

Meng Wei of Shanghai (CN)

APPARATUS WITH CIRCUIT MANAGEMENT MECHANISM AND METHODS FOR OPERATING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 17875827 titled 'APPARATUS WITH CIRCUIT MANAGEMENT MECHANISM AND METHODS FOR OPERATING THE SAME

Simplified Explanation

The patent application describes methods, apparatuses, and systems for adjusting the operation of memory dies based on real-time reliability measures. The apparatus is designed to determine reliability measures by initiating and completing a programming operation within specific timings after an erase operation, and then reading the programmed data within a specific window after completing the programming operation.

  • The patent application focuses on adjusting memory die operations based on real-time reliability measures.
  • Reliability measures are determined by timing the completion of programming operations following an erase operation.
  • The programmed data is then read within a specific window after completing the programming operation.
  • The invention aims to optimize memory die operations based on real-time reliability measures.

Potential Applications:

  • Memory management in electronic devices
  • Data storage systems
  • Flash memory technology
  • Solid-state drives (SSDs)
  • Embedded systems

Problems Solved:

  • Ensuring reliable and efficient memory operations
  • Optimizing memory die performance based on real-time reliability measures
  • Preventing data corruption and loss in memory systems

Benefits:

  • Improved reliability and performance of memory dies
  • Real-time adjustment of memory operations based on reliability measures
  • Enhanced data integrity and durability in memory systems
  • Efficient utilization of memory resources


Original Abstract Submitted

Disclosed herein are methods, apparatuses and systems related to adjusting operation of memory dies according to reliability measures determined in real-time. The apparatus may be configured to determine the reliability measures based on (1) initiating and completing a programming operation within respective timings following an erase operation and (2) reading the programmed data within a window from completing the programming operation.

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