17830047. CONTROLLING VARIATION OF VALID DATA COUNTS IN GARBAGE COLLECTION SOURCE BLOCKS simplified abstract (Micron Technology, Inc.)

From WikiPatents
Jump to navigation Jump to search

CONTROLLING VARIATION OF VALID DATA COUNTS IN GARBAGE COLLECTION SOURCE BLOCKS

Organization Name

Micron Technology, Inc.

Inventor(s)

Xiangyu Tang of San Jose CA (US)

David Ebsen of Minnetonka MN (US)

Ying Huang of Boise ID (US)

Sundararajan Sankaranarayanan of Fremont CA (US)

CONTROLLING VARIATION OF VALID DATA COUNTS IN GARBAGE COLLECTION SOURCE BLOCKS - A simplified explanation of the abstract

This abstract first appeared for US patent application 17830047 titled 'CONTROLLING VARIATION OF VALID DATA COUNTS IN GARBAGE COLLECTION SOURCE BLOCKS

Simplified Explanation

The abstract describes a method for identifying and selecting blocks of memory for garbage collection in a memory device. The method involves considering factors such as the valid data count and data temperature of each block, and comparing them according to specific criteria. The selected block is then used as the source for garbage collection.

  • Blocks of a memory device are identified based on a valid data count constraint.
  • The first block is selected based on its valid data count.
  • The second block is selected based on its data temperature.
  • The first and second blocks are compared using one or more comparison criteria.
  • Either the first or second block is chosen as the garbage collection source block based on the comparison.
  • Garbage collection is performed at the selected source block.

Potential Applications:

  • Memory management in computer systems and devices.
  • Optimization of garbage collection processes in memory devices.

Problems Solved:

  • Efficient identification and selection of blocks for garbage collection.
  • Improved memory management and performance.

Benefits:

  • More efficient garbage collection process.
  • Optimal utilization of memory resources.
  • Enhanced performance and reliability of memory devices.


Original Abstract Submitted

A subset of blocks from a set of blocks of a memory device are identified based on a valid data count constraint. A first block from the subset of blocks is selected based on a valid data count of the first block. A second block from the subset of blocks is selected based on a data temperature of the second block. A comparison of the first block and the second block is performed in accordance with one or more comparison criterion. The first block or the second block is selected as a garbage collection source block based on the comparison. Garbage collection is performed at the garbage collection source block.