17829913. EARLY STOPPING OF BIT-FLIP LOW DENSITY PARITY CHECK DECODING BASED ON SYNDROME WEIGHT simplified abstract (Micron Technology, Inc.)

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EARLY STOPPING OF BIT-FLIP LOW DENSITY PARITY CHECK DECODING BASED ON SYNDROME WEIGHT

Organization Name

Micron Technology, Inc.

Inventor(s)

Eyal En Gad of Santa Clara CA (US)

Mustafa N. Kaynak of San Diego CA (US)

Yoav Weinberg of Toronto (CA)

Zhengang Chen of San Jose CA (US)

Sivagnanam Parthasarathy of Carlsbad CA (US)

EARLY STOPPING OF BIT-FLIP LOW DENSITY PARITY CHECK DECODING BASED ON SYNDROME WEIGHT - A simplified explanation of the abstract

This abstract first appeared for US patent application 17829913 titled 'EARLY STOPPING OF BIT-FLIP LOW DENSITY PARITY CHECK DECODING BASED ON SYNDROME WEIGHT

Simplified Explanation

The abstract of this patent application describes a processing device in a memory system that determines the weight of a syndrome for a sense word read from a memory device. It then checks if the syndrome weight meets a certain threshold criterion. If it does, the device bypasses the first decoding operation and initiates a second decoding operation for the sense word, which has a higher error correction capability.

  • The processing device in a memory sub-system determines the syndrome weight for a sense word read from a memory device.
  • It checks if the syndrome weight satisfies a threshold criterion.
  • If the threshold criterion is met, the device skips the first decoding operation and starts a second decoding operation for the sense word.
  • The second decoding operation has a higher error correction capability than the first decoding operation.

Potential Applications

  • This technology can be applied in memory systems, such as computer memory or storage devices, to improve error correction capabilities.
  • It can be used in data centers or cloud computing environments to enhance the reliability and integrity of stored data.
  • The innovation can also be beneficial in embedded systems, where error correction is crucial for maintaining data integrity.

Problems Solved

  • The technology addresses the problem of errors in memory systems by providing a more efficient and effective error correction mechanism.
  • It solves the issue of potentially incorrect data being read from memory devices by improving the error correction capability.
  • The innovation helps prevent data corruption and loss, ensuring the accuracy and reliability of stored information.

Benefits

  • By bypassing the first decoding operation and initiating a second decoding operation with higher error correction capability, the technology improves the accuracy of data retrieval from memory devices.
  • It enhances the reliability and integrity of stored data, reducing the risk of data corruption or loss.
  • The innovation can lead to improved system performance and reduced downtime, as errors are corrected more efficiently.


Original Abstract Submitted

A processing device in a memory sub-system determines a syndrome weight for a sense word read from a memory device and determines whether the syndrome weight for the sense word satisfies a threshold criterion. Responsive to the syndrome weight for the sense word satisfying a respective threshold criterion associated with a next iteration of a first decoding operation, bypassing the first decoding operation and initiating a second decoding operation for the sense word, wherein the second decoding operation has a higher error correction capability than the first decoding operation.

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