17830800. CROSS-TEMPERATURE COMPENSATION IN NON-VOLATILE MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
CROSS-TEMPERATURE COMPENSATION IN NON-VOLATILE MEMORY DEVICES
Organization Name
Inventor(s)
Andrea Giovanni Xotta of Cornedo Vicentino (IT)
Umberto Siciliani of Rubano (IT)
CROSS-TEMPERATURE COMPENSATION IN NON-VOLATILE MEMORY DEVICES - A simplified explanation of the abstract
This abstract first appeared for US patent application 17830800 titled 'CROSS-TEMPERATURE COMPENSATION IN NON-VOLATILE MEMORY DEVICES
Simplified Explanation
The patent application describes a system and method for improving the read operation of a memory device based on the temperature at which the data was written.
- The system includes a memory device and a processing device.
- The processing device performs a first read operation on the memory device to retrieve data.
- The first data contains information about the temperature at which the data was written.
- The processing device determines the write temperature based on the first data.
- A read voltage value is calculated based on the write temperature.
- The processing device performs a second read operation on the memory device using the read voltage value to obtain the original data.
Potential Applications
- This technology can be applied in various memory devices such as solid-state drives (SSDs) and random-access memory (RAM).
- It can improve the read performance of memory devices by optimizing the read voltage based on the temperature at which the data was written.
Problems Solved
- Memory devices can experience variations in performance based on temperature.
- By considering the write temperature during the read operation, this technology helps mitigate the impact of temperature on read performance.
- It allows for more accurate retrieval of data, especially in scenarios where temperature fluctuations are common.
Benefits
- Improved read performance of memory devices.
- Enhanced accuracy in retrieving data, reducing the risk of errors.
- Increased reliability and efficiency of memory devices.
- Better adaptability to temperature changes, ensuring consistent performance.
Original Abstract Submitted
Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising performing a first read operation on the memory device to retrieve first data; determining, from the first data, second data indicative of a write temperature associated with the first data, wherein the write temperature is indicative of a temperature measured during a write operation; determining a read voltage value based on the second data; and performing a second read operation on the memory device using the read voltage value to obtain the first data.
