17877637. ACCESSING DATA USING ERROR CORRECTION OPERATION(S) TO REDUCE LATENCY AT A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
Contents
ACCESSING DATA USING ERROR CORRECTION OPERATION(S) TO REDUCE LATENCY AT A MEMORY SUB-SYSTEM
Organization Name
Inventor(s)
Vamsi Pavan Rayaprolu of Santa Clara CA (US)
Dung Viet Nguyen of San Jose CA (US)
Sampath K. Ratnam of San Jose CA (US)
Patrick R. Khayat of San Diego CA (US)
Thomas Herbert Lentz of Boise ID (US)
ACCESSING DATA USING ERROR CORRECTION OPERATION(S) TO REDUCE LATENCY AT A MEMORY SUB-SYSTEM - A simplified explanation of the abstract
This abstract first appeared for US patent application 17877637 titled 'ACCESSING DATA USING ERROR CORRECTION OPERATION(S) TO REDUCE LATENCY AT A MEMORY SUB-SYSTEM
Simplified Explanation
The abstract of the patent application describes a method for accessing data stored in a memory sub-system. The method involves determining whether the memory cells storing the data meet certain degradation criteria. If the cells meet the criteria, an error correction operation is performed to access the data.
- The patent application describes a method for accessing data programmed to a memory sub-system.
- The method involves determining if the memory cells storing the data satisfy one or more cell degradation criteria.
- If the cells meet the degradation criteria, an error correction operation is performed to access the data in response to a request.
- The innovation lies in the ability to detect and correct errors caused by cell degradation in the memory sub-system.
Potential applications of this technology:
- This technology can be applied in various electronic devices that use memory sub-systems, such as computers, smartphones, and tablets.
- It can be used in data storage systems to ensure the integrity and reliability of stored data.
- The method can be implemented in embedded systems, automotive electronics, and other devices that rely on memory for data storage.
Problems solved by this technology:
- Cell degradation in memory sub-systems can lead to data corruption and loss.
- This technology solves the problem of accessing data stored in memory cells that may have degraded over time.
- By performing error correction operations, the method ensures that the data can still be accessed accurately, even if the memory cells have degraded.
Benefits of this technology:
- Improved data reliability and integrity by detecting and correcting errors caused by cell degradation.
- Enhanced performance and efficiency of memory sub-systems by ensuring accurate data access.
- Extended lifespan of memory sub-systems by mitigating the impact of cell degradation.
Original Abstract Submitted
A request to access data programmed to a memory sub-system is received. A determination is made of whether memory cells of the memory sub-system that store the programmed data satisfy one or more cell degradation criteria. In response to a determination that the memory cells satisfy the one or more cell degradation criteria, an error correction operation to access the data is performed in accordance with the request.
