17877532. MEASURING A TIMING MARGIN OF A MEMORY DEVICE USING AN INTERNAL OSCILLOSCOPE simplified abstract (Micron Technology, Inc.)

MEASURING A TIMING MARGIN OF A MEMORY DEVICE USING AN INTERNAL OSCILLOSCOPE

Organization Name

Micron Technology, Inc.

Inventor(s)

Brandon Richard Nixon of Meridian ID (US)

MEASURING A TIMING MARGIN OF A MEMORY DEVICE USING AN INTERNAL OSCILLOSCOPE - A simplified explanation of the abstract

This abstract first appeared for US patent application 17877532 titled 'MEASURING A TIMING MARGIN OF A MEMORY DEVICE USING AN INTERNAL OSCILLOSCOPE

Simplified Explanation

The abstract of this patent application describes a method for identifying the first and last delay tap elements in a system clock of a receiving device, where the output of an internal oscilloscope matches a known randomized data pattern.

• The method involves inputting a known randomized data pattern at a predetermined reference voltage to the internal oscilloscope of the receiving device for each delay tap element.
• The first delay tap element in which the output of the internal oscilloscope matches the known randomized data pattern is identified.
• The last delay tap element in which the output of the internal oscilloscope matches the known randomized data pattern is also identified.

Potential applications of this technology:

• This method can be used in the testing and calibration of receiving devices that rely on delay tap elements in their system clock.
• It can be applied in various electronic systems, such as communication devices, data storage devices, and integrated circuits, to ensure accurate timing and synchronization.

Problems solved by this technology:

• The method provides a reliable way to identify the first and last delay tap elements in a system clock, which is crucial for proper functioning of receiving devices.
• It eliminates the need for manual testing and calibration, saving time and effort in the manufacturing and maintenance processes.

Benefits of this technology:

• The method improves the accuracy and reliability of receiving devices by ensuring the correct identification of delay tap elements.
• It simplifies the testing and calibration process, leading to increased efficiency and cost savings.
• The method can be easily implemented in existing systems without requiring significant modifications or additional hardware.

Original Abstract Submitted

A known randomized data pattern at a predetermined reference voltage of the internal oscilloscope is inputted to an internal oscilloscope of the receiving device for each delay tap element of a plurality of consecutive delay tap elements applied to a system clock of a receiving device. A first delay tap element among the plurality of consecutive delay tap elements in which an output of the internal oscilloscope matches the known randomized data pattern is identified. Responsive to identifying the first delay tap element, a last delay tap element among the plurality of consecutive delay tap elements in which the output of the internal oscilloscope matches the known randomized data pattern is identified.