17877240. WORDLINE LEAKAGE TEST MANAGEMENT simplified abstract (Micron Technology, Inc.)

WORDLINE LEAKAGE TEST MANAGEMENT

Organization Name

Micron Technology, Inc.

Inventor(s)

Wai Leong Chin of Singapore (SG)

Francis Chee Khai Chew of Singapore (SG)

Trismardawi Tanadi of Folsom CA (US)

Chun Sum Yeung of San Jose CA (US)

Lawrence Dumalag of Folsom CA (US)

Ekamdeep Singh of San Jose CA (US)

WORDLINE LEAKAGE TEST MANAGEMENT - A simplified explanation of the abstract

This abstract first appeared for US patent application 17877240 titled 'WORDLINE LEAKAGE TEST MANAGEMENT

Simplified Explanation

The abstract describes a patent application related to a processing device in a memory sub-system. The device determines if a media endurance metric of a memory block satisfies certain conditions. If the conditions are met, the temperature of the memory block is compared to a threshold temperature range. If the temperature is within the range, a wordline leakage test is executed on a wordline group of the memory block. The result of the test determines an action to be executed.

• The patent application relates to a processing device in a memory sub-system.
• The device checks if a media endurance metric of a memory block meets certain conditions.
• If the conditions are satisfied, the temperature of the memory block is compared to a threshold temperature range.
• If the temperature is within the range, a wordline leakage test is performed on a specific wordline group of the memory block.
• The result of the wordline leakage test determines an action to be executed.

Potential Applications:

• This technology can be applied in memory devices such as solid-state drives (SSDs) or flash memory to optimize performance and reliability.
• It can be used in data centers to enhance the efficiency and lifespan of memory systems.
• The innovation can be implemented in embedded systems or mobile devices to improve memory management and prevent failures.

Problems Solved:

• The technology addresses the issue of media endurance in memory blocks by checking if certain conditions are met before executing tests.
• It solves the problem of excessive temperature by comparing the temperature of the memory block to a threshold range before performing tests.
• The wordline leakage test helps identify potential issues or failures in specific wordline groups, allowing for proactive maintenance or replacement.

Benefits:

• By considering media endurance and temperature conditions, the technology helps prolong the lifespan of memory blocks and improves overall system reliability.
• The wordline leakage test enables early detection of faults or weaknesses in specific wordline groups, allowing for timely actions to prevent data loss or system failures.
• The innovation contributes to optimizing memory performance and efficiency, leading to enhanced user experience and cost savings in terms of maintenance and replacement.

Original Abstract Submitted

A processing device in a memory sub-system determines whether a media endurance metric associated with a memory block of a memory device satisfies one or more conditions. In response to the one or more conditions being satisfied, a temperature of the memory block is compared to a threshold temperature range. In response to determining the temperature of the memory block is within the threshold temperature range, the processing device causes execution of a wordline leakage test of a wordline group of a set of wordline groups of the memory block. A result of the wordline leakage test of the target wordline group is determined and an action is executed based on the result of the wordline leakage test.