17884076. ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)

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ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES

Organization Name

Micron Technology, Inc.

Inventor(s)

Patrick R. Khayat of San Diego CA (US)

Vamsi Pavan Rayaprolu of Santa Clara CA (US)

ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 17884076 titled 'ERROR-HANDLING MANAGEMENT DURING COPYBACK OPERATIONS IN MEMORY DEVICES

Simplified Explanation

The patent application describes a system and method involving a memory device and a processing device that work together to ensure data integrity in memory cells.

  • Select a source set of memory cells
  • Perform a data integrity check on the source set to obtain a data integrity metric value
  • If the data integrity metric value meets a threshold criterion, perform a first error-handling operation on the data
  • If the first operation fails to correct the data, perform a second error-handling operation
  • If the second operation successfully corrects the data, copy the corrected data to a destination set of memory cells

Potential Applications

  • Data storage systems
  • Computer memory devices
  • Data centers

Problems Solved

  • Ensuring data integrity in memory cells
  • Handling errors in stored data
  • Improving reliability of memory devices

Benefits

  • Enhanced data reliability
  • Improved error handling capabilities
  • Increased data integrity in memory storage


Original Abstract Submitted

Systems and methods are disclosed including a memory device and a processing device operatively coupled to the memory device. The processing device can perform operations comprising selecting a source set of memory cells of the memory device, performing a data integrity check on the source set of memory cells to obtain a data integrity metric value; responsive to determining that a data integrity metric value satisfies the threshold criterion, performing a first error-handling operation on the data stored on the source set of memory cells; responsive to determining that the first error-handling operation fails to correct the data, performing a second error-handling operation on the data; and responsive to determining that the second error-handling operation corrected the data, causing the memory device to copy the corrected data to a destination set of memory cells of the memory device.