17831086. MANAGING DATA INTEGRITY USING A CHANGE IN A NUMBER OF DATA ERRORS AND AN AMOUNT OF TIME IN WHICH THE CHANGE OCCURRED simplified abstract (Micron Technology, Inc.)

From WikiPatents
Jump to navigation Jump to search

MANAGING DATA INTEGRITY USING A CHANGE IN A NUMBER OF DATA ERRORS AND AN AMOUNT OF TIME IN WHICH THE CHANGE OCCURRED

Organization Name

Micron Technology, Inc.

Inventor(s)

Ryan G. Fisher of Boise ID (US)

MANAGING DATA INTEGRITY USING A CHANGE IN A NUMBER OF DATA ERRORS AND AN AMOUNT OF TIME IN WHICH THE CHANGE OCCURRED - A simplified explanation of the abstract

This abstract first appeared for US patent application 17831086 titled 'MANAGING DATA INTEGRITY USING A CHANGE IN A NUMBER OF DATA ERRORS AND AN AMOUNT OF TIME IN WHICH THE CHANGE OCCURRED

Simplified Explanation

The patent application describes methods, apparatuses, and systems for monitoring and maintaining data integrity in memory systems. Here is a simplified explanation of the abstract:

  • An initial data integrity scan is performed on a subset of memory to determine the error rate at a specific time.
  • The initial error rate and time are stored for reference.
  • A subsequent integrity scan is conducted on the same subset of memory at a later time to determine the new error rate.
  • The difference between the initial and subsequent error rates is calculated.
  • The difference between the initial and subsequent times is determined.
  • Based on these differences, a remedial action is selected and executed to address any detected errors.

Potential applications of this technology:

  • Memory systems in computer hardware and electronic devices.
  • Data storage systems in cloud computing and data centers.
  • Embedded systems and IoT devices with limited memory capacity.

Problems solved by this technology:

  • Ensuring data integrity in memory systems by detecting and addressing errors.
  • Preventing data corruption and loss due to memory errors.
  • Improving the reliability and performance of memory systems.

Benefits of this technology:

  • Early detection and correction of memory errors.
  • Improved data reliability and integrity.
  • Enhanced system performance and uptime.
  • Cost savings by avoiding data loss and system failures.


Original Abstract Submitted

Exemplary methods, apparatuses, and systems include performing an initial data integrity scan of a subset of memory at an initial time to determine an initial error rate for the subset of memory. The initial error rate and the initial time are stored. A subsequent integrity scan of the subset of memory is performed at a second time to determine a subsequent error rate for the subset of memory. A difference between the initial error rate and the subsequent error rate is determined. A difference between the initial time and the subsequent time is determined. A remedial action is selected using the difference between the initial error rate and the subsequent error rate and the difference between the initial time and the subsequent time and the remedial action is performed.

Retrieved from "http://wikipatents.org/index.php?title=17831086._MANAGING_DATA_INTEGRITY_USING_A_CHANGE_IN_A_NUMBER_OF_DATA_ERRORS_AND_AN_AMOUNT_OF_TIME_IN_WHICH_THE_CHANGE_OCCURRED_simplified_abstract_(Micron_Technology,_Inc.)&oldid=15793"