17823625. FILTERING METRICS ASSOCIATED WITH MEMORY simplified abstract (Micron Technology, Inc.)

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FILTERING METRICS ASSOCIATED WITH MEMORY

Organization Name

Micron Technology, Inc.

Inventor(s)

Dung Viet Nguyen of San Jose CA (US)

Shantilal Rayshi Doru of San Diego CA (US)

Jun Wan of San Jose CA (US)

Sampath Ratnam of San Jose CA (US)

FILTERING METRICS ASSOCIATED WITH MEMORY - A simplified explanation of the abstract

This abstract first appeared for US patent application 17823625 titled 'FILTERING METRICS ASSOCIATED WITH MEMORY

Simplified Explanation

The abstract describes a method where a controller of a memory device obtains metrics associated with the memory using different memory read configurations, applies a function to these metrics to obtain new read configurations, filters the metrics, provides them to a memory management process, and takes action based on the process output.

  • Controller obtains metrics using different memory read configurations
  • Function applied to metrics to obtain new read configurations
  • Metrics filtered to provide to memory management process
  • Action taken based on process output

Potential Applications

  • Memory optimization in devices
  • Performance enhancement in memory management systems

Problems Solved

  • Efficient memory utilization
  • Improved memory read configurations

Benefits

  • Enhanced memory performance
  • Optimal memory management
  • Improved overall system efficiency


Original Abstract Submitted

In some implementations, a controller of a memory device may obtain a first metric associated with a memory of the memory device using a first memory read configuration. The controller may apply a function to the first metric to obtain a second memory read configuration. The controller may obtain a second metric associated with the memory using the second memory read configuration. The controller may filter the first metric and the second metric to obtain a first filtered metric and a second filtered metric. The controller may provide the first filtered metric and the second filtered metric to a memory management process executing on the controller. The controller may perform an action based on an output of the memory management process, wherein the output is based on the first filtered metric and the second filtered metric.