17873869. VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME simplified abstract (Micron Technology, Inc.)
Contents
VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME
Organization Name
Inventor(s)
Subhasis Sasmal of Hyderabad (IN)
VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME - A simplified explanation of the abstract
This abstract first appeared for US patent application 17873869 titled 'VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME
Simplified Explanation
The abstract of this patent application describes an electronic device, such as a memory device, that includes circuit components and voltage testing circuits. The voltage testing circuits are used to determine if the signals from the circuit components are within acceptable voltage ranges. The innovation in this patent application is the use of multiple supply voltage levels for different components of the voltage testing circuit, which provides a sufficient headroom voltage gap between the received signals and the supply voltages.
- The electronic device includes various circuit components and voltage testing circuits.
- The voltage testing circuits determine if the signals from the circuit components are within acceptable voltage ranges.
- Multiple supply voltage levels are provided to different components of the voltage testing circuit.
- This provides a sufficient headroom voltage gap between the received signals and the supply voltages.
- Some active circuits of the voltage testing circuit receive a higher supply voltage compared to other circuits.
Potential applications of this technology:
- Memory devices
- Electronic devices with voltage testing circuits
Problems solved by this technology:
- Ensures accurate voltage measurement of received signals
- Prevents signals from exceeding acceptable voltage ranges
Benefits of this technology:
- Improved accuracy of voltage measurement
- Enhanced protection of circuit components from excessive voltage
Original Abstract Submitted
An electronic device, such as a memory device, may include various circuit components. The electronic device may also include one or more voltage testing circuits to determine whether signals of one or more of the circuit components are within acceptable voltage ranges of the respective circuit components. Systems and methods are described to improve correct voltage measurement of the received signals by a voltage testing circuit. In particular, multiple supply voltage levels are provided to different components of the voltage testing circuit to provide a sufficient headroom voltage gap between received signals and the supply voltages. For example, some active circuits (e.g., operational amplifiers) of the voltage testing circuit may receive a higher supply voltage of the electronic device compared to one or more other circuits of the voltage testing circuit.
