17856771. DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE simplified abstract (Micron Technology, Inc.)
DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE
Organization Name
Inventor(s)
Steven Michael Kientz of Westminster CO (US)
DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17856771 titled 'DIE FAMILY MANAGEMENT ON A MEMORY DEVICE USING BLOCK FAMILY ERROR AVOIDANCE
Simplified Explanation
The patent application describes a method for identifying a target block family in a memory device based on periodic program erase cycles (PECs). The target block family consists of multiple blocks.
- The target block family is identified periodically every predetermined number of program erase cycles (PECs).
- Each block family includes multiple blocks.
- The method involves obtaining the temporal voltage shift of each block in a subset of blocks from each die associated with the target block family.
- A die measurement is calculated for each die based on the average temporal voltage shifts of the subset of blocks.
- Each die is assigned to a die family based on its die measurement.
Potential Applications
- Memory device management and optimization.
- Improving the efficiency and performance of memory devices.
Problems Solved
- Efficient identification and management of block families in memory devices.
- Optimization of memory device performance.
Benefits
- Improved memory device performance.
- Enhanced memory device management and optimization.
Original Abstract Submitted
A target block family of a plurality of block families is identified periodically every predetermined number of program erase cycles (PECs) of a memory device. Each block family includes a plurality of blocks. A respective temporal voltage shift of each block of a subset of blocks of the target block family from each die of a plurality of dies associated with the target block family is obtained. A respective die measurement for each respective die is obtained based on an average of the respective temporal voltage shifts of the subset of blocks from each die. Each respective die to a respective die family of a plurality of consecutive die families is assigned based on the respective die measurement for each respective die.
