17830802. DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES simplified abstract (Micron Technology, Inc.)

DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES

Organization Name

Micron Technology, Inc.

Inventor(s)

Yu-Chung Lien of San Jose CA (US)

Li-Te Chang of San Jose CA (US)

Zhenming Zhou of San Jose CA (US)

DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES - A simplified explanation of the abstract

This abstract first appeared for US patent application 17830802 titled 'DYNAMIC READ LEVEL TRIM SELECTION FOR SCAN OPERATIONS OF MEMORY DEVICES

Simplified Explanation

The abstract describes a method for optimizing memory page scans in a computer system.

• The method starts by performing a first page read on the first memory page using a first trim value.
• It then determines if the first data state metric associated with the first page read meets a certain threshold criterion.
• If the criterion is met, a second page read is performed on the first memory page using a second trim value.
• The method then determines if the second data state metric associated with the second page read meets a second threshold criterion.
• If the second criterion is not met, the second trim value is selected for subsequent page reads during memory page scans.

Potential applications of this technology:

• This method can be used in computer systems that perform memory page scans, such as operating systems or database management systems.
• It can help optimize the scanning process by selecting the most appropriate trim value for page reads based on data state metrics.

Problems solved by this technology:

• Memory page scans can be time-consuming and resource-intensive.
• This method helps improve the efficiency of memory page scans by selecting the optimal trim value for page reads.

Benefits of this technology:

• By selecting the most suitable trim value, the method reduces the time and resources required for memory page scans.
• It improves the overall performance and efficiency of computer systems that rely on memory page scans.

Original Abstract Submitted

A first page read on the first memory page utilizing a first trim value is performed responsive to initiating a memory page scan on a first memory page of a plurality of memory pages. Whether a first data state metric associated with the first page read satisfies a first threshold criterion is determined. A second page read on the first memory page utilizing a second trim value is performed responsive to determining that the first data state metric satisfies the first threshold criterion. Whether a second data state metric associated with the second page read satisfies a second threshold criterion is determined. The second trim value to perform subsequent page reads during memory page scans is selected responsive to determining that the second data state metric does not satisfy the first threshold criterion.