17823806. MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING simplified abstract (Micron Technology, Inc.)
MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING
Organization Name
Inventor(s)
Theodore G. Doros of Fairfax VA (US)
MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING - A simplified explanation of the abstract
This abstract first appeared for US patent application 17823806 titled 'MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING
Simplified Explanation
The abstract describes a patent application for a test device that can analyze measurements of a memory device to identify defects and determine if they meet a failure threshold.
- Test device initiates measurements by sensors on both the test device and the memory device
- Analyzes measurements using a first model to identify defects in the memory device
- Uses a second model to determine if identified defects meet a failure threshold
- Provides an output indicating if the failure threshold is met for the memory device
Potential Applications
- Quality control in memory device manufacturing
- Fault detection in memory devices during testing processes
Problems Solved
- Efficient identification of defects in memory devices
- Streamlined testing process for memory devices
Benefits
- Improved reliability of memory devices
- Cost-effective testing process
- Faster detection of faulty memory devices
Original Abstract Submitted
In some implementations, a test device may initiate a set of measurements by a set of sensors of the test device and of a device under test (DUT), wherein the DUT is a memory device. The test device may obtain the set of measurements of the DUT from the set of sensors based on initiating the set of measurements. The test device may analyze the set of measurements of the DUT, using a first model, to identify one or more defects present with the DUT. The test device may determine, using a second model, that the one or more defects present with the DUT satisfy a failure threshold. The test device may provide, based on the failure threshold being satisfied for the DUT, an output indicating that the failure threshold is satisfied for the DUT.
