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Category:G11C7/10
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Pages in category "G11C7/10"
The following 177 pages are in this category, out of 177 total.
1
- 17659475. SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 17660232. SENSE AMPLIFIER INCLUDING PRE-AMPLIFYING CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17686147. COMPUTE-IN-MEMORY SYSTEMS AND METHODS WITH CONFIGURABLE INPUT AND SUMMING UNITS simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17689480. METHOD OF READING DATA IN A NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE PERFORMING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17722805. SEMICONDUCTOR DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17747318. METHOD OF STORING DATA IN MEMORIES simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 17750581. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17805090. MULTI-LEVEL CELLS, AND RELATED ARRAYS, DEVICES, SYSTEMS, AND METHODS simplified abstract (Micron Technology, Inc.)
- 17814640. MEMORY DEVICE, METHOD OF DRIVING THE MEMORY DEVICE, AND METHOD OF DRIVING HOST DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17815742. INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST USING A DATA MASK INVERSION BIT simplified abstract (Micron Technology, Inc.)
- 17821676. MEMORY WITH PARALLEL MAIN AND TEST INTERFACES simplified abstract (Micron Technology, Inc.)
- 17821740. Synchronous Input Buffer Control Using a State Machine simplified abstract (Micron Technology, Inc.)
- 17822909. APPARATUSES, SYSTEMS, AND METHODS FOR MODULE LEVEL ERROR CORRECTION simplified abstract (Micron Technology, Inc.)
- 17823458. Die Disablement simplified abstract (Micron Technology, Inc.)
- 17827126. RECEIVER FOR RECEIVING MULTI-LEVEL SIGNAL AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17831114. TRACKING THE EFFECTS OF VOLTAGE AND TEMPERATURE ON A MEMORY DEVICE USING AN INTERNAL OSCILLATOR simplified abstract (Micron Technology, Inc.)
- 17831251. SYNCHRONOUS INPUT BUFFER ENABLE FOR DFE OPERATION simplified abstract (Micron Technology, Inc.)
- 17831284. MEMORY CONTROLLER AND STORAGE DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 17831290. PRE-DECODER CIRCUITY simplified abstract (Micron Technology, Inc.)
- 17832261. MEMORY DEVICE AND METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17836634. MEMORY ARRAYS EMPLOYING FLYING BIT LINES TO INCREASE EFFECTIVE BIT LINE LENGTH FOR SUPPORTING HIGHER PERFORMANCE, INCREASED MEMORY DENSITY, AND RELATED METHODS simplified abstract (Microsoft Technology Licensing, LLC)
- 17847080. DATA STORAGE DEVICE WITH NOISE INJECTION simplified abstract (Western Digital Technologies, Inc.)
- 17852593. MEMORY DEVICE, MEMORY SYSTEM HAVING THE SAME, AND METHOD OF OPERATING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17852664. MEMORY DEVICE AND METHOD FOR CALIBRATING THE DEVICE AND FABRICATING THE DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17869061. MEMORY DEVICE, A MEMORY SYSTEM AND AN OPERATING METHOD OF THE MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17871917. MEMORY DEVICE AND METHOD FOR CONTROLLING ROW HAMMER simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17877592. MEMORY ROW-HAMMER MITIGATION simplified abstract (Micron Technology, Inc.)
- 17886423. METHOD FOR CONTROLLING SENSE AMPLIFIER AND CONTROL DEVICE USING THE SAME simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 17889369. ERROR DETECTION FOR A SEMICONDUCTOR DEVICE simplified abstract (Micron Technology, Inc.)
- 17894248. APPARATUS AND METHODS FOR PROGRAMMING DATA STATES OF MEMORY CELLS simplified abstract (Micron Technology, Inc.)
- 17895053. CONFIGURABLE DATA PROTECTION CIRCUITRY FOR MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17897438. DETERMINING READ VOLTAGE OFFSET IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 17899417. MANAGING PERFORMANCE AND SERVICE LIFE PREDICTION FOR A MEMORY SUBSYSTEM USING ENVIRONMENTAL FACTORS simplified abstract (Micron Technology, Inc.)
- 17899849. MEMORY ARRAY WITH COMPENSATED WORD LINE ACCESS DELAY simplified abstract (Micron Technology, Inc.)
- 17903578. CALIBRATION CIRCUIT AND SEMICONDUCTOR DEVICE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17930655. Synchronous Input Buffer Control Using a Ripple Counter simplified abstract (Micron Technology, Inc.)
- 17940935. Model Inversion in Integrated Circuit Devices having Analog Inference Capability simplified abstract (Micron Technology, Inc.)
- 17940955. Monitoring of User-Selected Conditions simplified abstract (Micron Technology, Inc.)
- 17942944. TEST MODE SECURITY CIRCUIT simplified abstract (Micron Technology, Inc.)
- 17944390. MATRIX FORMATION FOR PERFORMING COMPUTATIONAL OPERATIONS IN MEMORY simplified abstract (Micron Technology, Inc.)
- 17948423. DRIFT COMPENSATION FOR CODEWORDS IN MEMORY simplified abstract (Micron Technology, Inc.)
- 17949990. PPA IMPROVEMENT FOR VOLTAGE MODE DRIVER AND ON-DIE TERMINATION (ODT) simplified abstract (SanDisk Technologies LLC)
- 17951567. SEMICONDUCTOR DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17956784. Data Storage with Improved Cache Read simplified abstract (Western Digital Technologies, Inc.)
- 17958386. NONVOLATILE MEMORY DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 17959663. APPARATUS, MEMORY DEVICE, AND METHOD FOR MULTI-PHASE CLOCK TRAINING simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17962992. RECEIVER RECEIVING MULTI-LEVEL SIGNAL, MEMORY DEVICE INCLUDING THE SAME AND METHOD OF RECEIVING DATA USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17965369. APPARATUS AND METHOD FOR READING DATA BASED ON A PROGRAM STATUS OF A NON-VOLATILE MEMORY DEVICE simplified abstract (SK hynix Inc.)
- 17972300. NON-VOLATILE MEMORY DEVICE FOR DETECTING DEFECTS OF BIT LINES AND WORD LINES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17984757. APPARATUS AND METHOD FOR ZQ CALIBRATION simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17988797. PAGE BUFFER CIRCUIT AND MEMORY DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18051142. STATIC RANDOM-ACCESS MEMORY (SRAM) APPARATUS AND METHOD FOR REDUCING WIRE DELAY simplified abstract (Samsung Electronics Co., Ltd.)
- 18057328. NON-VOLATILE MEMORY DEVICE, METHOD OF OPERATING THE DEVICE, AND MEMORY SYSTEM INCLUDING THE DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18067224. NON-VOLATILE MEMORY DEVICE, STORAGE DEVICE INCLUDING THE SAME, AND READ METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18080282. MEMORY DEVICE INCLUDING ERROR CORRECTION DEVICE simplified abstract (SK hynix Inc.)
- 18093728. RANDOM DATA GENERATION CIRCUIT AND READ/WRITE TRAINING CIRCUIT simplified abstract (Changxin Memory Technologies, Inc.)
- 18108737. DEVICE AND METHOD WITH COMPUTATIONAL MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18152919. DATA RECEIVING CIRCUIT, DATA RECEIVING SYSTEM, AND MEMORY DEVICE simplified abstract (Changxin Memory Technologies, Inc.)
- 18163146. MEMORY CIRCUIT ARCHITECTURE simplified abstract (QUALCOMM Incorporated)
- 18166737. MEMORY DEVICE, MEMORY SYSTEM AND METHOD FOR OPERATING MEMORY SYSTEM simplified abstract (Samsung Electronics Co., Ltd.)
- 18170109. MEMORY DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18176121. POWER REDUCTION IN A CLOCK BUFFER OF A MEMORY MODULE BASED UPON MEMORY MODULE SPEED simplified abstract (Dell Products L.P.)
- 18176268. CONTROLLING MEMORY MODULE CLOCK BUFFER POWER IN A SYSTEM WITH A SINGLE MEMORY CLOCK PER MEMORY MODULE simplified abstract (Dell Products L.P.)
- 18178038. SEMICONDUCTOR DEVICE simplified abstract (Kioxia Corporation)
- 18184329. SEMICONDUCTOR STORAGE DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)
- 18184329. SEMICONDUCTOR STORAGE DEVICE simplified abstract (TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION)
- 18198623. GENERATING SEMI-SOFT BIT DATA DURING CORRECTIVE READ OPERATIONS IN MEMORY DEVICES simplified abstract (Micron Technology, Inc.)
- 18201089. MINIMUM MEMORY CLOCK ESTIMATION PROCEDURES simplified abstract (Micron Technology, Inc.)
- 18215036. SEMICONDUCTOR SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18220363. Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds simplified abstract (Western Digital Technologies, Inc.)
- 18235848. ZQ CALIBRATION CIRCUIT, OPERATION METHOD OF THE ZQ CALIBRATION CIRCUIT, AND SEMICONDUCTOR MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18237816. CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)
- 18238232. MEMORY DEVICE AND MEMORY SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18243350. MEMORY DEVICE, METHOD OF CALIBRATING SIGNAL LEVEL THEREOF, AND MEMORY SYSTEM HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18303937. METHOD OF READING DATA FROM SELF-SELECTING MEMORY, SELF-SELECTING MEMORY PERFORMING THE SAME AND METHOD OF OPERATING SELF-SELECTING MEMORY USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18317344. STORAGE DEVICES HAVING MULTI DROP STRUCTURE simplified abstract (Samsung Electronics Co., Ltd.)
- 18322725. STORAGE DEVICE, NON-VOLATILE MEMORY DEVICE, AND METHOD OF OPERATING THE NON-VOLATILE MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18331223. EQUALIZER FOR REMOVING INTER SYMBOL INTERFERENCE OF DATA SIGNAL BY INCREASING PULSE WIDTHS OF LOGIC LOW LEVEL AND LOGIC HIGH LEVEL OF DATA SIGNAL simplified abstract (Samsung Electronics Co., Ltd.)
- 18336302. SEMICONDUCTOR INTEGRATED CIRCUIT, RECEIVING DEVICE, AND MEMORY SYSTEM simplified abstract (Kioxia Corporation)
- 18343929. APPARATUSES AND METHODS FOR MEMORY ALIGNMENT simplified abstract (MICRON TECHNOLOGY, INC.)
- 18347641. OFFSET CALIBRATION TRAINING METHOD FOR ADJUSTING DATA RECEIVER OFFSET AND MEMORY DEVICE THEREFOR simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18351039. APPARATUS AND METHOD WITH IN-MEMORY COMPUTING (IMC) simplified abstract (Samsung Electronics Co., Ltd.)
- 18351629. Global Boosting Circuit simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18361132. NONVOLATILE MEMORY INCLUDING ON-DIE-TERMINATION CIRCUIT AND STORAGE DEVICE INCLUDING THE NONVOLATILE MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18364026. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18364490. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18372726. APPARATUS FOR TRANSMITTING AND RECEIVING A SIGNAL, A METHOD OF OPERATING THE SAME, A MEMORY DEVICE, AND A METHOD OF OPERATING THE MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18374026. NON-VOLATILE MEMORY DEVICE, OPERATING METHOD THEREOF, CONTROLLER FOR CONTROLLING THE SAME, AND STORAGE DEVICE HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18388461. TECHNOLOGIES FOR DYNAMICALLY MANAGING RESOURCES IN DISAGGREGATED ACCELERATORS simplified abstract (Intel Corporation)
- 18448902. MEMORY DEVICE AND ZQ CALIBRATION METHOD simplified abstract (Changxin Memory Technologies, Inc.)
- 18451946. MEMORY DEVICE simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18455575. MEMORY SYSTEM HAVING A NON-VOLATILE MEMORY AND A CONTROLLER CONFIGURED TO SWITCH A MODE FOR CONTROLLING AN ACCESS OPERATION TO THE NON-VOLATILE MEMORY simplified abstract (Kioxia Corporation)
- 18455904. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 18455953. APPARATUSES AND METHODS FOR PROVIDING COMMAND HAVING ON-THE-FLY (OTF) LATENCY TO MEMORY simplified abstract (Samsung Electronics Co., Ltd.)
- 18457742. MEMORY CHIP, MEMORY CONTROLLER AND OPERATING METHOD OF THE MEMORY CHIP simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18464618. ZQ CALIBRATION CIRCUIT FOR MULTIPLE INTERFACES simplified abstract (Samsung Electronics Co., Ltd.)
- 18473492. OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18475890. System Control Using Sparse Data simplified abstract (Apple Inc.)
- 18486518. SEMICONDUCTOR MEMORY DEVICE EMPLOYING PROCESSING IN MEMORY (PIM) AND METHOD OF OPERATING THE SEMICONDUCTOR MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18493051. MEMORY DEVICE AND OPERATION METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18496693. APPARATUS, MEMORY CONTROLLER, MEMORY DEVICE, MEMORY SYSTEM, AND METHOD FOR CLOCK SWITCHING AND LOW POWER CONSUMPTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18509082. MULTI-PORT MEMORY DEVICE AND A METHOD OF USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18516143. BUFFER CONTROL OF MULTIPLE MEMORY BANKS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18518157. LOW POWER WAKE UP FOR MEMORY simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18520612. Memory system simplified abstract (Kioxia Corporation)
- 18538263. MEMORY DEVICE PERFORMING SELF-CALIBRATION BY IDENTIFYING LOCATION INFORMATION AND MEMORY MODULE INCLUDING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
2
- 20240012573. WRITE TRAINING IN MEMORY DEVICES simplified abstract (Lodestar Licensing Group, LLC)
- 20240086342.SEMICONDUCTOR SYSTEM simplified abstract (samsung electronics co., ltd.)
- 20240087620.MULTI-PORT MEMORY DEVICE AND A METHOD OF USING THE SAME simplified abstract (samsung electronics co., ltd.)
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- Kabushiki kaisha toshiba (20240096380). SEMICONDUCTOR STORAGE DEVICE simplified abstract
- KABUSHIKI KAISHA TOSHIBA patent applications on March 21st, 2024
- Kioxia corporation (20240094941). Memory system simplified abstract
- Kioxia corporation (20240096381). SEMICONDUCTOR INTEGRATED CIRCUIT, RECEIVING DEVICE, AND MEMORY SYSTEM simplified abstract
- Kioxia corporation (20240097658). SEMICONDUCTOR DEVICE simplified abstract
- Kioxia Corporation patent applications on March 21st, 2024
M
- Micron technology, inc. (20240127872). EXTENDED ADDRESS INTERFACE ACTIVATE SEQUENCE USING MODE REGISTER WRITE simplified abstract
- Micron technology, inc. (20240127902). INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST simplified abstract
- Micron Technology, Inc. patent applications on April 18th, 2024
- Micron Technology, Inc. patent applications on February 1st, 2024
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on February 8th, 2024
- MICRON TECHNOLOGY, INC. patent applications on January 25th, 2024
- Micron Technology, Inc. patent applications on March 14th, 2024
Q
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- Samsung electronics co., ltd. (20240096382). ZQ CALIBRATION CIRCUIT FOR MULTIPLE INTERFACES simplified abstract
- Samsung electronics co., ltd. (20240105250). SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM simplified abstract
- Samsung electronics co., ltd. (20240111695). MEMORY DEVICE PERFORMING SELF-CALIBRATION BY IDENTIFYING LOCATION INFORMATION AND MEMORY MODULE INCLUDING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240112708). DEVICE AND METHOD WITH COMPUTATIONAL MEMORY simplified abstract
- Samsung electronics co., ltd. (20240112709). METHOD OF READING DATA FROM SELF-SELECTING MEMORY, SELF-SELECTING MEMORY PERFORMING THE SAME AND METHOD OF OPERATING SELF-SELECTING MEMORY USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240127869). STORAGE DEVICES HAVING MULTI DROP STRUCTURE simplified abstract
- Samsung electronics co., ltd. (20240127871). ZQ CALIBRATION CIRCUIT, OPERATION METHOD OF THE ZQ CALIBRATION CIRCUIT, AND SEMICONDUCTOR MEMORY DEVICE simplified abstract
- Samsung electronics co., ltd. (20240135977). OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on April 25th, 2024
- Samsung Electronics Co., Ltd. patent applications on April 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on February 29th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 25th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 14th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 21st, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 28th, 2024
- SK hynix Inc. patent applications on January 18th, 2024
T
- Taiwan semiconductor manufacturing co., ltd. (20240096383). MEMORY DEVICE simplified abstract
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on January 25th, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 21st, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. patent applications on February 15th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on February 8th, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. patent applications on January 18th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on March 14th, 2024
U
- US Patent Application 17752573. APPARATUSES AND METHODS FOR COMMAND DECODING simplified abstract
- US Patent Application 17752605. APPARATUSES AND METHODS FOR COMMAND DECODING simplified abstract
- US Patent Application 17828921. CHIP SELECT, COMMAND, AND ADDRESS ENCODING simplified abstract
- US Patent Application 17952008. SEMICONDUCTOR DEVICE FOR PERFORMING DATA ALIGNMENT OPERATION simplified abstract
- US Patent Application 17974940. METHODS OF OPERATING A NEAR MEMORY PROCESSING-DUAL IN-LINE MEMORY MODULE (NMP-DIMM) FOR PERFORMING A READ OPERATION AND AN ADAPTIVE LATENCY MODULE AND A SYSTEM THEREOF simplified abstract
- US Patent Application 18169159. TIMING SEQUENCE CONTROL CIRCUIT, TIMING SEQUENCE CONTROL METHOD, AND SEMICONDUCTOR MEMORY simplified abstract
- US Patent Application 18202584. DRIVE STRENGTH CALIBRATION FOR MULTI-LEVEL SIGNALING simplified abstract
- US Patent Application 18202659. APPARATUSES AND METHODS FOR OPERATIONS IN A SELF-REFRESH STATE simplified abstract
- US Patent Application 18232542. MEMORY DEVICE WITH SOURCE LINE CONTROL simplified abstract
- US Patent Application 18232949. MEMORY DEVICES FOR MULTIPLE READ OPERATIONS simplified abstract
- US Patent Application 18357769. SERIES OF PARALLEL SENSING OPERATIONS FOR MULTI-LEVEL CELLS simplified abstract
- US Patent Application 18446818. Systems and Methods for Controlling Power Management Operations in a Memory Device simplified abstract
- US Patent Application 18447950. OPERATING METHOD OF MEMORY DEVICE FOR EXTENDING SYNCHRONIZATION OF DATA CLOCK SIGNAL, AND OPERATING METHOD OF ELECTRONIC DEVICE INCLUDING THE SAME simplified abstract
- US Patent Application 18448152. NON-VOLATILE MEMORY CIRCUIT AND METHOD simplified abstract
- US Patent Application 18448794. PRINT COMPONENT WITH MEMORY CIRCUIT simplified abstract
- US Patent Application 18449060. SIGNAL SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY simplified abstract
- US Patent Application 18449252. SEMICONDUCTOR DEVICES AND SEMICONDUCTOR SYSTEMS CALIBRATING TERMINATION RESISTANCE simplified abstract
- US Patent Application 18449864. MEMORY DEVICE, OPERATION METHOD OF MEMORY DEVICE, AND PAGE BUFFER INCLUDED IN MEMORY DEVICE simplified abstract