18220363. Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds simplified abstract (Western Digital Technologies, Inc.)
Contents
- 1 Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Abstract
- 1.6 Patent/Innovation Explanation
- 1.7 Potential Applications
- 1.8 Problems Solved
- 1.9 Benefits
- 1.10 Original Abstract Submitted
Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds
Organization Name
Western Digital Technologies, Inc.
Inventor(s)
Alexander Bazarsky of Holon (IL)
Eran Sharon of Rishon Lezion (IL)
David Avraham of San Jose CA (US)
Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds - A simplified explanation of the abstract
This abstract first appeared for US patent application 18220363 titled 'Storage System and Method for Circuit-Bounded-Array-Based Time and Temperature Tag Management and Inference of Read Thresholds
Simplified Explanation
Abstract
A storage system with an inference engine that can determine a read threshold based on various memory parameters. This read threshold can be used during regular read operations or error handling processes. By using a machine-learning approach, the accuracy of the read threshold can be greatly improved, resulting in reduced bit error rate, improved latency, throughput, power consumption, and quality of service. Additionally, a circuit-bounded array is utilized to manage updates to time and temperature tag information and to infer read thresholds.
Patent/Innovation Explanation
- A storage system with an inference engine that can determine a read threshold based on memory parameters.
- The read threshold can be used during regular read operations or error handling processes.
- Utilizes a machine-learning approach to improve the accuracy of the read threshold.
- A circuit-bounded array is used to manage updates to time and temperature tag information and to infer read thresholds.
Potential Applications
- Data storage systems
- Computer memory systems
- Error handling processes in storage devices
Problems Solved
- Inaccurate read thresholds in storage systems
- High bit error rate
- Poor latency, throughput, power consumption, and quality of service
Benefits
- Improved accuracy of read thresholds
- Reduced bit error rate
- Improved latency, throughput, power consumption, and quality of service
Original Abstract Submitted
A storage system has an inference engine that can infer a read threshold based on a plurality of parameters of the memory. The read threshold can be used in reading a wordline in the memory during a regular read operation or as part of an error handling process. Using a machine-learning-based approach to infer a read threshold can provide significant improvement in read threshold accuracy, which can reduce bit error rate and improve latency, throughput, power consumption, and quality of service. In another embodiment, a circuit-bounded array is used to manage updates to time and temperature tag information and to infer read thresholds.
