17889369. ERROR DETECTION FOR A SEMICONDUCTOR DEVICE simplified abstract (Micron Technology, Inc.)
Contents
ERROR DETECTION FOR A SEMICONDUCTOR DEVICE
Organization Name
Inventor(s)
Matthew Young of Allen TX (US)
John E. Riley of McKinney TX (US)
ERROR DETECTION FOR A SEMICONDUCTOR DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 17889369 titled 'ERROR DETECTION FOR A SEMICONDUCTOR DEVICE
Simplified Explanation
The present disclosure is about a technology for error detection in a semiconductor device. It includes an apparatus with a memory array, a detector array, and a detector. The detector is designed to identify errors in a portion of the detector array and send an output signal to memory components connected to the detector array when an error is detected.
- The technology is focused on error detection for a semiconductor device.
- The apparatus consists of a memory array, a detector array, and a detector.
- The detector is responsible for detecting errors in a specific part of the detector array.
- When an error is detected, the detector sends an output signal to the memory components connected to the detector array.
Potential Applications
This technology can have various applications in the field of semiconductor devices, including:
- Integrated circuits
- Microprocessors
- Memory modules
- Data storage devices
Problems Solved
The technology addresses the following problems:
- Error detection in semiconductor devices
- Ensuring the accuracy and reliability of data stored in memory arrays
- Identifying and isolating faulty portions of a detector array
Benefits
The technology offers several benefits, such as:
- Improved error detection capabilities in semiconductor devices
- Enhanced reliability and accuracy of data stored in memory arrays
- Efficient identification and isolation of errors in the detector array
- Facilitates prompt response and corrective actions for detected errors.
Original Abstract Submitted
The present disclosure includes apparatus, methods, and systems for error detection for a semiconductor device. An apparatus includes a memory array, a detector array, and a detector coupled to the detector array. The detector is configured to detect an error in a portion of the detector array and output an output signal to memory components coupled to the detector array in response to detecting the error.
