18473492. OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

From WikiPatents
Jump to navigation Jump to search

OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

HOON Shin of Suwon-si (KR)

JAEWOOK Lee of Seoul (KR)

DONGHWEE Kim of Suwon-si (KR)

RIHAE Park of Seoul (KR)

OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE - A simplified explanation of the abstract

This abstract first appeared for US patent application 18473492 titled 'OPERATING METHOD OF MEMORY CONTROLLER, AND MEMORY DEVICE

Simplified Explanation

The abstract describes a memory device and operating method of a memory controller that involves performing a NOT operation for data of a cell. The method includes forming reference voltages in a bit line connected to the cell, sensing inversion data based on the voltages, and outputting the result of the NOT operation.

  • Determining when a NOT operation for data of a cell is to be performed
  • Forming reference voltages in a bit line connected to the cell
  • Sensing inversion data based on the voltages
  • Outputting the result of the NOT operation

Potential Applications

This technology could be applied in various memory devices, such as flash memory, to improve data processing and storage capabilities.

Problems Solved

This technology helps in efficiently performing NOT operations for data stored in memory cells, enhancing data processing speed and accuracy.

Benefits

The benefits of this technology include faster data processing, improved memory controller efficiency, and enhanced overall performance of memory devices.

Potential Commercial Applications

The potential commercial applications of this technology include use in consumer electronics, data storage systems, and other devices that rely on memory controllers for data processing.

Possible Prior Art

One possible prior art for this technology could be memory devices with similar NOT operation capabilities, but with different methods of voltage sensing and data output.

Unanswered Questions

How does this technology compare to existing memory devices with NOT operation capabilities?

This article does not provide a direct comparison to existing memory devices with similar functionalities.

What are the specific voltage ranges used in forming the reference voltages for the NOT operation in this technology?

The article does not specify the exact voltage ranges used in forming the reference voltages for the NOT operation.


Original Abstract Submitted

A memory device and an operating method of a memory controller are described in which the operating method includes determining that a NOT operation for data of a cell is to be performed by the memory device; forming, in a bit line connected to the cell, a reference voltage between a first voltage corresponding to the data and a second voltage corresponding to inversion data of the data; forming, in the bit line, a third voltage between the second voltage and the reference voltage by connecting the bit line and a bit line bar; forming the reference voltage in the bit line bar; and sensing the inversion data based on the third voltage formed in the bit line and the reference voltage formed in the bit line bar, wherein the inversion data comprises an output of the NOT operation for the data of the cell.