18237816. CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM simplified abstract (Micron Technology, Inc.)

CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM

Organization Name

Micron Technology, Inc.

Inventor(s)

Andrea Giovanni Xotta of Cornedo Vicentino (IT)

Umberto Siciliani of Rubano (IT)

Tommaso Vali of Sezze (IT)

CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18237816 titled 'CROSS-TEMPERATURE COMPENSATION IN A MEMORY SUB-SYSTEM

Simplified Explanation

The abstract describes a memory device control logic that reads data from a memory array based on a request from a requestor, taking into account temperature considerations.

• Memory device control logic receives a request to read data from a specific segment of the memory array.
• The control logic performs a first read operation using pre-configured read operation parameters to read the data and associated write temperature.
• It checks if the read operation parameters meet a temperature criterion.
• If the parameters do not meet the criterion, the control logic updates the read operation parameters and performs a second read operation.
• The updated parameters are used to read the data from the memory array.

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1. 1. 1. Potential Applications

• This technology can be used in memory devices for data storage applications where temperature considerations are important.
• It can be applied in systems where data retrieval performance is affected by temperature variations.

1. 1. 1. Problems Solved

• Ensures data integrity and reliability by considering temperature effects during data retrieval.
• Optimizes data retrieval performance by adjusting read operation parameters based on temperature conditions.

1. 1. 1. Benefits

• Improved data reliability by taking temperature factors into account.
• Enhanced data retrieval performance by optimizing read operation parameters based on temperature variations.
• Overall increased efficiency and effectiveness of memory devices in various applications.

Original Abstract Submitted

Control logic in a memory device receives, from a requestor, a request to read data from the memory array, the request comprising an indication of a segment of the memory array where the data is stored and performs, using previously configured read operation parameters, a first read operation to read the data and a write temperature associated with the data from the memory array. The control logic determines whether the previously configured read operation parameters satisfy a temperature criterion and responsive to determining that the previously configured read operation parameters do not satisfy the temperature criterion, configures the memory device with updated read operation parameters, and performs, using the updated read operation parameters, a second read operation to read the data from the memory array.