Category:CHANGXIN MEMORY TECHNOLOGIES, INC.
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CHANGXIN MEMORY TECHNOLOGIES, INC.
CHANGXIN MEMORY TECHNOLOGIES, INC. (often abbreviated as CXMT) is a prominent company in the field of semiconductor manufacturing, with a specific focus on DRAM (Dynamic Random-Access Memory) products. Founded in China, CXMT has been instrumental in driving innovation in the global memory semiconductor industry.
Contents
Overview
CXMT specializes in the development, manufacturing, and sales of integrated circuit products. As a key player in the semiconductor sector, the company aims to reduce reliance on foreign technology in the memory chip market. Their focus on DRAM technology places them at the forefront of a critical component in a wide range of electronic devices, from computers to smartphones.
Innovation and Patents
The innovation landscape at CXMT is rich and diverse, with the company holding numerous patents in semiconductor technology. Their R&D efforts are centered around improving the efficiency, performance, and cost-effectiveness of memory technologies. Some of their key innovations include:
- Advanced Memory Chip Design: Focusing on the development of cutting-edge DRAM chips, CXMT's designs emphasize high-speed, low-power consumption, and increased storage capacity.
- Manufacturing Process Innovations: The company employs advanced manufacturing processes to enhance the yield and quality of their DRAM products.
Lesser Known Aspects
While CXMT is a significant name in the semiconductor industry, it's also notable for its contributions to the development of memory technologies in China, contributing to the country's self-reliance in semiconductor production.
External Links
For more information about CHANGXIN MEMORY TECHNOLOGIES, INC., visit their website: [1]
IPC Classifications
Relevant IPC classifications for CXMT's innovations include:
- G11C: This category encompasses patents related to static storage devices, addressing the structure and functionality of semiconductor memory.
- H01L: This classification covers semiconductor devices in general, including their manufacture and related processes.
Categories
Pages in category "CHANGXIN MEMORY TECHNOLOGIES, INC."
The following 60 pages are in this category, out of 60 total.
1
- 18157059. MEMORY AND OPERATING METHOD THEREFOR simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18163072. Semiconductor Structure and Method Making the Same simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18166492. SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18168542. TRANSISTOR, SEMICONDUCTOR STRUCTURE, MEMORY, AND METHOD FOR FORMING SAME simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18168899. SEMICONDUCTOR STRUCTURE, PREPARATION METHOD THEREFOR AND MEMORY simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18169167. MEMORY AND METHOD FOR OPERATING THE SAME simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18232489. DATA RECEIVING CIRCUIT, DATA RECEIVING SYSTEM, AND STORAGE APPARATUS simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18366814. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18450509. SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18451077. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFOR, AND MEMORY simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18510864. SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18511808. SEMICONDUCTOR STRUCTURE AND FORMING METHOD AND OPERATING METHOD THEREFOR simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18524136. SINGLE-LOOP MEMORY DEVICE, DOUBLE-LOOP MEMORY DEVICE, AND ZQ CALIBRATION METHOD simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18525467. SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAME simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
- 18527249. DATA SAMPLING CIRCUIT, DELAY DETECTION CIRCUIT AND MEMORY simplified abstract (CHANGXIN MEMORY TECHNOLOGIES, INC.)
P
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- US Patent Application 17813409. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 17815623. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 17816130. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 17816156. TRANSISTOR AND MANUFACTURING METHOD THEREOF, AND MEMORY simplified abstract
- US Patent Application 17816435. TRANSISTOR AND MANUFACTURING METHOD THEREOF, AND MEMORY simplified abstract
- US Patent Application 17816436. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 17816438. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 17868774. METHOD FOR SENSE MARGIN DETECTION FOR SENSE AMPLIFIER AND ELECTRONIC DEVICE simplified abstract
- US Patent Application 17872479. METHOD AND DEVICE FOR EVALUATING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENT simplified abstract
- US Patent Application 17878046. SEMICONDUCTOR STRUCTURE AND FORMATION METHOD THEREOF simplified abstract
- US Patent Application 17879913. SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 17885727. MEMORY, SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME simplified abstract
- US Patent Application 17887775. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 17898727. METHOD AND APPARATUS FOR CHECKING SIGNAL LINE simplified abstract
- US Patent Application 17899056. METHOD AND APPARATUS FOR TESTING COMMAND, TEST PLATFORM, AND READABLE STORAGE MEDIUM simplified abstract
- US Patent Application 17899684. SEMICONDUCTOR STRUCTURE AND METHOD FOR PREPARING SAME simplified abstract
- US Patent Application 17929747. ANTI-FUSE STRUCTURE, ANTI-FUSE ARRAY AND MEMORY simplified abstract
- US Patent Application 17929842. METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 17951625. PACKAGE SUBSTRATE, APPARATUS FOR TESTING POWER SUPPLY NOISE AND METHOD FOR TESTING POWER SUPPLY NOISE simplified abstract
- US Patent Application 18093779. SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 18150885. SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF simplified abstract
- US Patent Application 18151360. SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SAME simplified abstract
- US Patent Application 18151434. TRANSISTOR, MANUFACTURING METHOD THEREOF, AND MEMORY simplified abstract
- US Patent Application 18153312. REFRESH ADDRESS GENERATION CIRCUIT simplified abstract
- US Patent Application 18157558. REFRESH CONTROL CIRCUIT, MEMORY, AND REFRESH CONTROL METHOD simplified abstract
- US Patent Application 18163135. SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 18167024. SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 18169159. TIMING SEQUENCE CONTROL CIRCUIT, TIMING SEQUENCE CONTROL METHOD, AND SEMICONDUCTOR MEMORY simplified abstract
- US Patent Application 18169839. SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME simplified abstract
- US Patent Application 18327062. POWER SUPPLY SWITCHING CIRCUIT AND MEMORY simplified abstract
- US Patent Application 18332706. REFRESH ADDRESS GENERATION CIRCUIT AND METHOD, MEMORY, AND ELECTRONIC DEVICE simplified abstract
- US Patent Application 18363819. METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE, SEMICONDUCTOR STRUCTURE, AND MEMORY simplified abstract
- US Patent Application 18363833. METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 18363901. MANUFACTURING METHOD OF SEMICONDUCTOR STRUCTURE, SEMICONDUCTOR STRUCTURE, AND MEMORY simplified abstract
- US Patent Application 18446507. METHOD FOR FORMING CAPACITOR AND SEMICONDUCTOR DEVICE simplified abstract
- US Patent Application 18446514. SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE simplified abstract
- US Patent Application 18448340. CIRCUIT FOR CALIBRATION CONTROL, ELECTRONIC DEVICE AND METHOD FOR CALIBRATION CONTROL simplified abstract
- US Patent Application 18448891. DATA PROCESSING CIRCUITRY AND METHOD, AND SEMICONDUCTOR MEMORY simplified abstract
- US Patent Application 18448897. SIGNAL SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY simplified abstract
- US Patent Application 18449060. SIGNAL SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY simplified abstract
