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Category:G11C29/12
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Pages in category "G11C29/12"
The following 47 pages are in this category, out of 47 total.
1
- 17693571. NONVOLATILE MEMORY DEVICE AND METHOD OF DETECTING WORDLINE DEFECT OF THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17697240. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17807303. MEMORY SECTION SELECTION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17807307. REFRESH RATE SELECTION FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17820280. NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING NONVOLATILE MEMORY simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17873869. VOLTAGE TESTING CIRCUIT WITH ERROR PROTECTION SCHEME simplified abstract (Micron Technology, Inc.)
- 17943706. BUILT-IN SELF-TEST BURST PATTERNS BASED ON ARCHITECTURE OF MEMORY simplified abstract (Micron Technology, Inc.)
- 17949867. TESTING OPERATIONS FOR MEMORY SYSTEMS simplified abstract (Micron Technology, Inc.)
- 17954663. SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 18059124. MEMORY DEVICE AND TEST METHOD OF MEMORY DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18059462. BUILT-IN SELF-TEST CIRCUITS FOR MEMORY SYSTEMS HAVING MULTIPLE CHANNELS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18068337. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18096407. SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract (SK hynix Inc.)
- 18100969. TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract (SK hynix Inc.)
- 18174186. SEMICONDUCTOR MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18205083. MEMORY SUB-SYSTEM THRESHOLD VOLTAGE MODIFICATION OPERATIONS simplified abstract (Micron Technology, Inc.)
- 18215474. MEMORY DEVICE INTERFACE AND METHOD simplified abstract (Micron Technology, Inc.)
- 18222563. MEMORY SYSTEM, OPERATING METHOD OF THE SAME, AND CONTROLLER OF MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18223298. PROGRAM REFRESH WITH GATE-INDUCED DRAIN LEAKAGE simplified abstract (Micron Technology, Inc.)
- 18302034. SEMICONDUCTOR MEMORY DEVICES THAT SUPPORT ENHANCED DATA RECOVERY OPERATIONS simplified abstract (Samsung Electronics Co., Ltd.)
- 18312280. LOOPBACK DATAPATH FOR CLOCK QUALITY DETECTION simplified abstract (Micron Technology, Inc.)
- 18392740. AT-SPEED TEST OF FUNCTIONAL MEMORY INTERFACE LOGIC IN DEVICES simplified abstract (Texas Instruments Incorporated)
- 18455031. METHOD FOR OPTIMIZING FLASH MEMORY CHIP AND RELATED APPARATUS simplified abstract (HUAWEI TECHNOLOGIES CO., LTD.)
- 18486789. CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18521382. WEIGHTED WEAR LEVELING FOR IMPROVING UNIFORMITY simplified abstract (Micron Technology, Inc.)
M
- Micron technology, inc. (20240127901). TEMPERATURE-BASED ERROR MASKING DURING MBIST OPERATION simplified abstract
- Micron technology, inc. (20240127902). INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST simplified abstract
- Micron Technology, Inc. patent applications on April 18th, 2024
- Micron Technology, Inc. patent applications on February 1st, 2024
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on February 8th, 2024
- Micron Technology, Inc. patent applications on January 18th, 2024
- MICRON TECHNOLOGY, INC. patent applications on January 25th, 2024
- Micron Technology, Inc. patent applications on March 14th, 2024
S
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on February 29th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on January 25th, 2024
- Sk hynix inc. (20240120014). TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME simplified abstract
- Sk hynix inc. (20240120015). SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024
T
U
- US Patent Application 17980141. MEMORY AND OPERATION METHOD THEREOF simplified abstract
- US Patent Application 18060437. MEMORY CONTROLLER AND OPERATING METHOD THEREOF simplified abstract
- US Patent Application 18109830. INTERPOSERS FOR MEMORY DEVICE TESTING AND CHARACTERIZATION, INCLUDING INTERPOSERS FOR TESTING AND CHARACTERIZING DECISION FEEDBACK EQUALIZATION CIRCUITRY OF DDR5 MEMORY DEVICES simplified abstract
- US Patent Application 18365868. MEMORY MODULE WITH REDUCED ECC OVERHEAD AND MEMORY SYSTEM simplified abstract