17954663. SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF
Organization Name
Inventor(s)
Sangwan Nam of Hwaseong-si (KR)
SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF - A simplified explanation of the abstract
This abstract first appeared for US patent application 17954663 titled 'SEMICONDUCTOR MEMORY DEVICE DETECTING DEFECT, AND OPERATING METHOD THEREOF
Simplified Explanation
The abstract describes a memory device and its operating method for detecting defects. The memory device consists of a memory cell area that stores data and a peripheral circuit area that controls the memory cell array. The peripheral circuit area includes a defect detection circuit that generates a count result value by selecting a first input signal from multiple input signals and counting the time intervals of the first input signal based on a clock signal. The defect detection circuit compares the count result value with an expected value to detect defects in the first input signal.
- The memory device includes a memory cell area and a peripheral circuit area.
- The peripheral circuit area contains a control logic and a defect detection circuit.
- The defect detection circuit generates a count result value by selecting a first input signal and counting its time intervals.
- The count result value is compared with an expected value to detect defects in the first input signal.
- The time intervals refer to the duration of logic low or logic high in the first input signal.
Potential Applications
- Memory devices with defect detection capabilities can be used in various industries, such as consumer electronics, automotive, and aerospace.
- This technology can be applied in data storage devices, such as solid-state drives (SSDs) and memory cards, to ensure data integrity and reliability.
- It can also be used in embedded systems and microcontrollers to detect defects in memory operations and improve system performance.
Problems Solved
- The memory device addresses the issue of defects in input signals by providing a defect detection circuit.
- Defects in input signals can lead to data corruption and system errors, which can be costly and detrimental in various applications.
- By detecting defects, the memory device can prevent data loss and improve the overall reliability of the system.
Benefits
- The memory device's defect detection circuit allows for early detection of defects in input signals, minimizing the risk of data corruption and system errors.
- By comparing the count result value with an expected value, the memory device can accurately identify and locate defects in the first input signal.
- The ability to detect defects in memory operations enhances the overall performance and reliability of the memory device.
- The memory device's defect detection capability can contribute to cost savings by reducing the need for manual inspection and troubleshooting.
Original Abstract Submitted
Provided are a memory device detecting a defect and an operating method thereof. The memory device includes a memory cell area including a memory cell array that stores data, and a peripheral circuit area including a control logic configured to control operations of the memory cell array, wherein the peripheral circuit area further includes a defect detection circuit, the defect detection circuit being configured to generate a count result value by selecting a first input signal from a plurality of input signals and counting at least one time interval of the first input signal based on a clock signal, and to detect a defect of the first input signal by comparing an expected value with the count result value, and the at least one time interval is a length of time in which logic low or logic high is maintained.
