18096407. SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST simplified abstract (SK hynix Inc.)

SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST

Organization Name

SK hynix Inc.

Inventor(s)

Choung Ki Song of Icheon-si Gyeonggi-do (KR)

SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST - A simplified explanation of the abstract

This abstract first appeared for US patent application 18096407 titled 'SEMICONDUCTOR DEVICE AND METHOD FOR PERFORMING TEST

Simplified Explanation

The semiconductor device described in the patent application includes a self-test circuit that generates an internal clock with a higher frequency than the external clock, extracts an instruction signal from a pre-instruction signal through a data line, and generates an internal control signal from the instruction signal. Additionally, there is a command control circuit that generates a test command to perform a self-test on first and second memory cells to determine if a defect has occurred based on the internal clock and control signal. A data control circuit outputs data stored in the first memory cells based on the test command and stores data output from the first memory cells in the second memory cells.

• Self-test circuit generates internal clock with higher frequency than external clock
• Command control circuit generates test command for self-test on memory cells
• Data control circuit outputs and stores data in memory cells

Potential Applications

The technology described in this patent application could be applied in various semiconductor devices that require self-testing capabilities, such as microcontrollers, memory modules, and integrated circuits.

Problems Solved

This technology helps in identifying defects in memory cells efficiently and accurately, ensuring the reliability and functionality of semiconductor devices.

Benefits

The self-test circuit and control circuits improve the overall performance and reliability of semiconductor devices by enabling quick and accurate testing of memory cells.

Potential Commercial Applications

One potential commercial application of this technology could be in the manufacturing of high-performance electronic devices that require reliable memory storage and efficient self-testing capabilities.

Possible Prior Art

One possible prior art for this technology could be the use of built-in self-test (BIST) circuits in semiconductor devices for testing memory cells.

What is the specific frequency of the internal clock generated by the self-test circuit?

The specific frequency of the internal clock generated by the self-test circuit is higher than the frequency of the clock applied from an external device.

How does the command control circuit determine if a defect has occurred in the memory cells during the self-test?

The command control circuit determines if a defect has occurred in the memory cells based on the internal clock and the internal control signal generated by the self-test circuit.

Original Abstract Submitted

A semiconductor device includes a self-test circuit configured to generate an internal clock having a higher frequency than a clock applied from a device external to the semiconductor device, to generate an instruction signal from a pre-instruction signal extracted through a data line, and to generate an internal control signal from the instruction signal. The semiconductor device also includes a command control circuit configured to generate a test command to perform a self-test for determining whether a defect has occurred in first memory cells and second memory cells based on the internal clock and the internal control signal. The semiconductor device further includes a data control circuit configured to output data stored in the first memory cells based on the test command, and to store data output from the first memory cells in the second memory cells.