18312280. LOOPBACK DATAPATH FOR CLOCK QUALITY DETECTION simplified abstract (Micron Technology, Inc.)

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LOOPBACK DATAPATH FOR CLOCK QUALITY DETECTION

Organization Name

Micron Technology, Inc.

Inventor(s)

Matthew Alan Prather of Boise ID (US)

Won Ho Choi of Santa Clara CA (US)

LOOPBACK DATAPATH FOR CLOCK QUALITY DETECTION - A simplified explanation of the abstract

This abstract first appeared for US patent application 18312280 titled 'LOOPBACK DATAPATH FOR CLOCK QUALITY DETECTION

Simplified Explanation

The patent application describes devices and methods for monitoring the operation of a memory device by transmitting loopback signals. Here is a simplified explanation of the abstract:

  • Memory devices can monitor their own operation by generating loopback signals.
  • The memory device receives a system clock signal from a host device and generates an internal clock signal based on it.
  • The memory device then generates a loopback signal based on the internal clock signal and transmits it through a loopback datapath.
  • The host device compares the internal clock signal with the system clock signal to determine the accuracy of the internal clock signal.
  • The termination values of the memory device can be adjusted based on the fidelity of the internal clock signal.

Potential applications of this technology:

  • Memory device testing and debugging: The loopback signals can be used to monitor the operation of memory devices during testing and debugging processes.
  • Performance optimization: By adjusting the termination values based on the fidelity of the internal clock signal, the memory device's performance can be optimized.

Problems solved by this technology:

  • Monitoring memory device operation: The loopback signals provide a way to monitor the operation of memory devices and identify any potential issues or inaccuracies.
  • Clock signal fidelity determination: By comparing the internal clock signal with the system clock signal, the accuracy of the internal clock signal can be determined.

Benefits of this technology:

  • Improved memory device performance: By adjusting the termination values based on the fidelity of the internal clock signal, the memory device can operate more efficiently and reliably.
  • Enhanced testing and debugging capabilities: The loopback signals allow for better monitoring and analysis of memory device operation, facilitating faster and more accurate testing and debugging processes.


Original Abstract Submitted

Devices and methods include transmitting loopback signals for monitoring operation of a memory device. In some embodiments, a memory device may receive a system clock signal from a host device and may generate an internal clock signal based at least in part on the system clock signal. In some embodiments, the memory device may generate a loopback signal based at least in part on the internal clock signal and may transmit the loopback signal via a loopback datapath associated with the memory device. A host device may compare the internal clock signal and the system clock signal to determine a fidelity of the internal clock signal. Termination values of the memory device may be adjusted based on the determined fidelity of the internal clock signal.

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