17697240. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
Organization Name
Inventor(s)
Soongmann Shin of Hwaseong-si (KR)
STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES - A simplified explanation of the abstract
This abstract first appeared for US patent application 17697240 titled 'STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES
Simplified Explanation
The abstract describes a storage device that includes a storage controller with analog circuits and a nonvolatile memory device with two regions. The second region stores user data, while the first region stores trimming control codes as a compensation data set. These codes compensate for offsets in the analog circuits and are obtained through a wafer-level test on the storage controller. During power-up, the storage controller reads the compensation data set, stores it, and adjusts the offsets of the analog circuits based on the stored data.
- The storage device includes a storage controller with analog circuits and a nonvolatile memory device with two regions.
- The second region of the nonvolatile memory device stores user data.
- The first region of the nonvolatile memory device stores trimming control codes as a compensation data set.
- The trimming control codes compensate for offsets in the analog circuits.
- The trimming control codes are obtained through a wafer-level test on the storage controller.
- During power-up, the storage controller reads the compensation data set from the first region.
- The storage controller stores the read compensation data set and adjusts the offsets of the analog circuits based on the stored data.
Potential Applications
- This technology can be applied in various storage devices such as solid-state drives (SSDs) and memory cards.
- It can improve the performance and reliability of storage devices by compensating for offsets in analog circuits.
Problems Solved
- Analog circuits in storage devices may have offsets that can affect their performance and reliability.
- The compensation data set stored in the nonvolatile memory device helps to adjust these offsets, solving the problem of inaccurate analog circuit operation.
Benefits
- The storage device can provide improved performance and reliability due to the compensation of analog circuit offsets.
- The wafer-level test allows for accurate trimming control codes to be obtained, ensuring precise compensation.
- The storage controller can adjust the offsets during power-up, simplifying the calibration process.
Original Abstract Submitted
Example embodiments provide for a storage device that includes a storage controller including a plurality of analog circuits and at least one nonvolatile memory device including a first region and a second region. The at least one nonvolatile memory device stores user data in the second region and stores trimming control codes in the first region as a compensation data set. The trimming control codes are configured to compensate for offsets of the plurality of analog circuits and are obtained through a wafer-level test on the storage controller. The storage controller, during a power-up sequence, reads the compensation data set from the first region of the at least one nonvolatile memory device, stores the read compensation data set therein, and adjusts the offsets of the plurality of analog circuits based on the stored compensation data set.
