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Category:G01R31/317
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Pages in category "G01R31/317"
The following 52 pages are in this category, out of 52 total.
1
- 17662327. INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17849945. SEMICONDUCTOR INTEGRATED CIRCUIT, A METHOD FOR TESTING THE SEMICONDUCTOR INTEGRATED CIRCUIT, AND A SEMICONDUCTOR SYSTEM simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17851860. TEST CIRCUIT USING CLOCK GATING SCHEME TO HOLD CAPTURE PROCEDURE AND BYPASS MODE, AND INTEGRATED CIRCUIT INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17859870. SYSTEM ON CHIP FOR PERFORMING SCAN TEST AND METHOD OF DESIGNING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17895826. SYSTEMS AND TECHNIQUES FOR TIMING MISMATCH REDUCTION simplified abstract (Micron Technology, Inc.)
- 17932808. FLEXIBLE ONE-HOT DECODING LOGIC FOR CLOCK CONTROLS simplified abstract (NVIDIA Corporation)
- 17958071. Secure Remote Debugging simplified abstract (Intel Corporation)
- 17988989. SYSTEM AND METHOD OF MONITORING PERFORMANCE OF AN ELECTRONIC DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18158181. TRAINING METHOD AND TEST APPARATUS USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18177809. TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (Kioxia Corporation)
- 18219484. METHODS FOR DETERMINING AND CALIBRATING NON-LINEARITY IN A PHASE INTERPOLATOR AND RELATED DEVICES AND SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18229965. LOW POWER ENVIRONMENT FOR HIGH PERFORMANCE PROCESSOR WITHOUT LOW POWER MODE simplified abstract (ADVANTEST CORPORATION)
- 18232341. NOVEL JITTER NOISE DETECTOR simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18355177. SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION simplified abstract (SK hynix Inc.)
- 18368195. 3D TAP & SCAN PORT ARCHITECTURES simplified abstract (Texas Instruments Incorporated)
- 18403623. SCAN ARCHITECTURE FOR INTERCONNECT TESTING IN 3D INTEGRATED CIRCUITS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18447955. FLIP FLOP STANDARD CELL simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18463730. MEMORY, MEMORY SYSTEM AND METHOD OF CONTROLLING STORAGE DEVICE simplified abstract (Kioxia Corporation)
- 18471624. WAFER LEVEL METHODS OF TESTING SEMICONDUCTOR DEVICES USING INTERNALLY-GENERATED TEST ENABLE SIGNALS simplified abstract (Samsung Electronics Co., Ltd.)
- 18474217. SENSOR MODULE simplified abstract (SEIKO EPSON CORPORATION)
- 18518629. CIRCUIT SCREENING SYSTEM AND CIRCUIT SCREENING METHOD simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.)
- 18521432. METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18524900. INTERPOSER CIRCUIT simplified abstract (TEXAS INSTRUMENTS INCORPORATED)
2
- 20240012048. IP CORE TESTING APPARATUS simplified abstract (Infineon Technologies AG)
- 20240044973. Detecting a Function Section in a Representation of a Quantum Circuit simplified abstract (Classiq Technologies LTD.)
- 20240044978. METHODS FOR DETERMINING AND CALIBRATING NON-LINEARITY IN A PHASE INTERPOLATOR AND RELATED DEVICES AND SYSTEMS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
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- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 8th, 2024
- Seiko epson corporation (20240110960). SENSOR MODULE simplified abstract
- SEIKO EPSON CORPORATION patent applications on April 4th, 2024
- Sk hynix inc. (20240118339). SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024
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- Taiwan semiconductor manufacturing co., ltd. (20240094281). METHOD OF TESTING AN INTEGRATED CIRCUIT AND TESTING SYSTEM simplified abstract
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 21st, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on April 25th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on February 29th, 2024
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- US Patent Application 17827834. ELECTRONIC CIRCUIT AND METHOD OF ERROR CORRECTION simplified abstract
- US Patent Application 17872479. METHOD AND DEVICE FOR EVALUATING PERFORMANCE OF SEQUENTIAL LOGIC ELEMENT simplified abstract
- US Patent Application 18234003. SCAN TESTING USING SCAN FRAMES WITH EMBEDDED COMMANDS simplified abstract
- US Patent Application 18303401. Built-in Self-Test for Die-to-Die Physical Interfaces simplified abstract