18177809. TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (Kioxia Corporation)

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TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM

Organization Name

Kioxia Corporation

Inventor(s)

Kazuhiko Nakahara of Yokohama (JP)

TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18177809 titled 'TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM

Simplified Explanation

The abstract describes a test system for a device under test (DUT) that includes a test board, a test executable integrated circuit, and a measuring apparatus. The test executable integrated circuit reads firmware stored in the DUT and performs tests on the DUT. The measuring apparatus instructs the test executable integrated circuit to start the test.

  • The test system includes a test board, a test executable integrated circuit, and a measuring apparatus.
  • The DUT is mounted on the test board.
  • The test executable integrated circuit is mounted on the test board and reads firmware stored in the DUT.
  • The test executable integrated circuit tests the DUT.
  • The measuring apparatus instructs the test executable integrated circuit to start the test.

Potential applications of this technology:

  • Electronics manufacturing industry
  • Quality control processes
  • Testing of various electronic devices

Problems solved by this technology:

  • Reducing costs required for tests
  • Shortening test time

Benefits of this technology:

  • Cost savings in testing processes
  • Increased efficiency in testing
  • Faster turnaround time for testing electronic devices


Original Abstract Submitted

According to a certain embodiment, the test system includes a first test board, a test executable integrated circuit, and a first measuring apparatus. A device under test (DUT) is mounted on the first test board. The test executable integrated circuit is mounted on the first test board, and is configured to read firmware stored in the DUT in advance and to test the DUT. The first measuring apparatus instructs the test executable integrated circuit to start a test of the DUT. There are provided the test system, the test method, and the non-transitory computer readable medium, capable of reducing costs required for tests and also of shortening test time.

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