17662327. INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)

INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT

Organization Name

SAMSUNG ELECTRONICS CO., LTD.

Inventor(s)

Yeon Ho Jung of Suwon-si (KR)

Jong Wook Kye of Suwon-si (KR)

Min Woo Kwak of Seoul (KR)

Mi Joung Kim of Hwaseong-si (KR)

Chan Wook Park of Seongnam-si (KR)

Do Hoon Byun of Hwaseong-si (KR)

Je Kyun Ryu of Seoul (KR)

Kwan Seong Lee of Yongin-si (KR)

Jae Ho Lee of Incheon (KR)

Jae Seung Choi of Hwaseong-si (KR)

INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT - A simplified explanation of the abstract

This abstract first appeared for US patent application 17662327 titled 'INTEGRATED CIRCUIT AND AN ELECTRONIC DEVICE INCLUDING INTEGRATED CIRCUIT

Simplified Explanation

The patent application describes an integrated circuit and an electronic device that includes the integrated circuit. The integrated circuit consists of a sequential logic circuit, a control unit, and a monitoring circuit.

• The sequential logic circuit includes a series of scan cells, with a first scan cell receiving a scan input. The scan cells are connected in series.
• The control unit receives a selection signal that includes the output of each scan cell. It then outputs a control signal based on the selection signal.
• The monitoring circuit receives the control signal and performs monitoring of data at a specific node in the sequential logic circuit. It outputs the result of the monitoring to a monitoring node.

Potential applications of this technology:

• This technology can be used in various electronic devices that require sequential logic circuits, such as computers, smartphones, and IoT devices.
• It can be applied in the design and manufacturing of integrated circuits for improved functionality and reliability.

Problems solved by this technology:

• The integrated circuit allows for efficient monitoring of data at specific nodes in the sequential logic circuit, providing better control and analysis of the circuit's behavior.
• It helps in identifying and diagnosing any issues or errors in the circuit, allowing for easier debugging and troubleshooting.

Benefits of this technology:

• The integrated circuit provides enhanced monitoring capabilities, allowing for better analysis and control of the circuit's performance.
• It improves the reliability and functionality of electronic devices by enabling efficient monitoring and detection of any issues in the sequential logic circuit.
• The technology can contribute to the development of more advanced and reliable integrated circuits for various applications.

Original Abstract Submitted

An integrated circuit and an electronic device including the integrated circuit are provided. An integrated circuit includes a sequential logic circuit, which includes a first scan cell that is configured to receive a scan input, and a plurality of scan cells sequentially connected in series from the first scan cell, a control unit, which is configured to receive a selection signal including an output of each of the plurality of scan cells, and is further configured to output a control signal responsive to the selection signal, and a monitoring circuit, which is configured to receive the control signal, is configured to perform first monitoring of first data at a first node that is an observation node in the sequential logic circuit responsive to the control signal, and is configured to output a result of the first monitoring to a monitoring node.