18355177. SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION simplified abstract (SK hynix Inc.)

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SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION

Organization Name

SK hynix Inc.

Inventor(s)

YU-AN Chen of Zhubei City Hsinchu County (TW)

NY-WEN Sheu of Zhubei City Hsinchu County (TW)

SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION - A simplified explanation of the abstract

This abstract first appeared for US patent application 18355177 titled 'SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION

Simplified Explanation

The abstract describes a system and method for circuit validation, which includes a prototype system and a computing device. The prototype system is equipped with a programming logic device circuit that implements a modified circuit design, including a circuit module as a design under test (DUT), an input generation circuit, and an output acquisition circuit. The computing device is used to generate a test signal to test the DUT on the prototype system.

  • The circuit validation system includes a prototype system and a computing device.
  • The prototype system features a programming logic device circuit that implements a modified circuit design.
  • The modified circuit design consists of a circuit module as a DUT, an input generation circuit, and an output acquisition circuit.
  • The computing device is capable of generating a test signal to test the DUT on the prototype system.

Potential Applications

The technology described in the patent application could be applied in the following areas:

  • Electronics testing and validation
  • Circuit design and development
  • Quality control in manufacturing processes

Problems Solved

The system and method for circuit validation address the following issues:

  • Ensuring the functionality and reliability of circuit designs
  • Streamlining the testing process for complex circuits
  • Improving the accuracy of test results

Benefits

The technology offers the following benefits:

  • Increased efficiency in circuit validation procedures
  • Enhanced accuracy in identifying and resolving design flaws
  • Cost-effective testing solutions for electronic devices

Potential Commercial Applications

The system and method for circuit validation could find commercial applications in:

  • Semiconductor industry
  • Electronics manufacturing companies
  • Research and development laboratories

Possible Prior Art

One possible prior art in this field is the use of simulation software for circuit testing and validation. These tools allow engineers to simulate the behavior of circuits before physical implementation, helping to identify potential issues early in the design process.

Unanswered Questions

How does the system handle complex circuit designs during validation?

The article does not provide specific details on how the system manages complex circuit designs and ensures accurate validation results. Further information on the scalability and performance of the system with intricate circuits would be beneficial.

What are the limitations of the prototype system in terms of circuit validation?

The article does not mention any potential drawbacks or limitations of the prototype system for circuit validation. Understanding the constraints of the system, such as compatibility issues or testing speed, would provide a more comprehensive view of its capabilities.


Original Abstract Submitted

System, method for circuit validation, and system and method for facilitating circuit validation are provided. The circuit validation system comprises a prototype system and a computing device. The prototype system comprises a programming logic device circuit configured to implement a modified circuit design. The modified circuit design includes a circuit module as a design under test (DUT), an input generation circuit coupled to the circuit module for outputting input signals to the circuit module in response to a test signal, and an output acquisition circuit coupled to the circuit module for storing output data from the circuit module. The computing device is capable of being coupled to the prototype system and configured to generate the test signal to perform a test of the DUT on the prototype system.

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