Sk hynix inc. (20240118339). SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION simplified abstract
Contents
- 1 SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Original Abstract Submitted
SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION
Organization Name
Inventor(s)
YU-AN Chen of Zhubei City Hsinchu County (TW)
NY-WEN Sheu of Zhubei City Hsinchu County (TW)
SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240118339 titled 'SYSTEM, METHOD FOR CIRCUIT VALIDATION, AND SYSTEM AND METHOD FOR FACILITATING CIRCUIT VALIDATION
Simplified Explanation
The abstract describes a system and method for circuit validation, including a prototype system with a modified circuit design and a computing device for testing the design.
- The circuit validation system includes a prototype system and a computing device.
- The prototype system has a programming logic device circuit to implement a modified circuit design.
- The modified circuit design consists of a circuit module as a design under test (DUT), an input generation circuit for providing input signals to the circuit module, and an output acquisition circuit for storing output data.
- The computing device can generate a test signal to test the DUT on the prototype system.
Potential Applications
This technology can be applied in the semiconductor industry for testing and validating new circuit designs before mass production.
Problems Solved
This technology helps in identifying and rectifying any issues or errors in circuit designs before they are manufactured, saving time and resources.
Benefits
The system and method described in the patent application improve the efficiency and accuracy of circuit validation processes, leading to higher quality and reliability of electronic devices.
Potential Commercial Applications
One potential commercial application of this technology is in the development of consumer electronics, ensuring that the circuits function correctly before being integrated into final products.
Possible Prior Art
Prior art in the field of circuit validation includes traditional testing methods using simulation software and physical prototypes to verify circuit designs.
What are the specific components of the prototype system mentioned in the abstract?
The specific components of the prototype system mentioned in the abstract are the programming logic device circuit, the input generation circuit, and the output acquisition circuit.
How does the computing device interact with the prototype system for circuit validation?
The computing device interacts with the prototype system by generating a test signal to perform a test of the DUT on the prototype system, allowing for the validation of the circuit design.
Original Abstract Submitted
system, method for circuit validation, and system and method for facilitating circuit validation are provided. the circuit validation system comprises a prototype system and a computing device. the prototype system comprises a programming logic device circuit configured to implement a modified circuit design. the modified circuit design includes a circuit module as a design under test (dut), an input generation circuit coupled to the circuit module for outputting input signals to the circuit module in response to a test signal, and an output acquisition circuit coupled to the circuit module for storing output data from the circuit module. the computing device is capable of being coupled to the prototype system and configured to generate the test signal to perform a test of the dut on the prototype system.