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Category:CPC G01N21/9501
Pages in category "CPC G01N21/9501"
The following 77 pages are in this category, out of 77 total.
1
- 18228807. METHOD OF INSPECTING SEMICONDUCTOR DEVICE simplified abstract (Samsung Electronics Co., Ltd.)
- 18405546. MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING simplified abstract (Applied Materials, Inc.)
- 18469107. OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18493226. SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18533528. INSPECTION DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18624444. PARALLEL SCANNING OVERLAY METROLOGY WITH OPTICAL META-SURFACES simplified abstract (KLA Corporation)
- 18962220. METHOD FOR INSPECTING PATTERN DEFECTS (Taiwan Semiconductor Manufacturing Co., Ltd.)
2
- 20250164410. Optical Metrology (Tokyo Electron Limited)
- 20250164411. Methods Systems Spectr (KLA)
- 20250172503. Automatic M (.Infineon Technologies Canada .)
- 20250189460. Wafer Defect Analyzing De (INGENTEC)
- 20250216338. Micro Led Detection Dev (BUENO OPTICS ., .)
- 20250216339. Wafer (BRIGHTEST TECHNOLOGY TAIWAN ., .)
- 20250216340. Meth (CHENG MEI INSTRUMENT TECHNOLOGY ., .)
- 20250216341. Inspection App (Mitsubishi Electric)
- 20250216342. Inspection Layer Improve Detection Defects Through Optical Systems Methods Inspecting Semiconductor Device De (Taiwan Semiconductor Manufacturing Limited)
- 20250231121. Wafer Inspection (SAMSUNG ELECTRONICS ., .)
A
- Applied materials, inc. (20240248046). MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUCTOR MANUFACTURING simplified abstract
- APPLIED MATERIALS, INC. Patent Application Trends in 2025
- Applied Materials, Inc. patent applications on July 25th, 2024
- ASML NETHERLANDS B.V. Patent Application Trends in 2024
- ASML NETHERLANDS B.V. Patent Application Trends in 2025
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- Samsung Display Co., LTD Patent Application Trends in 2024
- SAMSUNG DISPLAY CO., LTD. Patent Application Trends in 2024
- Samsung Display Co., Ltd. Patent Application Trends in 2024
- SAMSUNG ELECTRONICS CO., LTD Patent Application Trends in 2024
- Samsung electronics co., ltd. (20240201104). INSPECTION DEVICE simplified abstract
- Samsung electronics co., ltd. (20240219314). OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT METHOD USING THE SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract
- Samsung electronics co., ltd. (20240219315). SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD simplified abstract
- Samsung electronics co., ltd. (20240255439). DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD
- Samsung electronics co., ltd. (20240255439). DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD simplified abstract
- Samsung electronics co., ltd. (20240353350). WAFER ABNORMALITY DETECTION METHOD AND A SEMICONDUCTOR DEVICE MANUFACTURING METHOD USING THE SAME simplified abstract
- Samsung Electronics Co., Ltd. Patent Application Trends in 2024
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2024
- Samsung electronics Co., Ltd. Patent Application Trends in 2024
- Samsung electronics CO., LTD. Patent Application Trends in 2025
- SAMSUNG ELECTRONICS CO., LTD. Patent Application Trends in 2025
- Samsung Electronics Co., Ltd. patent applications on August 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on July 4th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on July 4th, 2024
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
- Samsung Electronics Co., Ltd. patent applications on October 24th, 2024
- SEMES CO., LTD. Patent Application Trends in 2024
- SHIN-ETSU HANDOTAI CO., LTD. Patent Application Trends in 2024
- Siemens Industry Software Inc. Patent Application Trends in 2024
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- Taiwan Semiconductor Manufacturing Co., Ltd Patent Application Trends in 2024
- Taiwan semiconductor manufacturing co., ltd. (20250093278). METHOD FOR INSPECTING PATTERN DEFECTS
- Taiwan Semiconductor Manufacturing Co., Ltd. Patent Application Trends in 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. Patent Application Trends in 2025
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on March 20th, 2025
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. Patent Application Trends in 2025
- Taiwan Semiconductor Manufacturing Company Patent Application Trends in 2025
- Taiwan Semiconductor Manufacturing Company, Ltd. Patent Application Trends in 2025
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. Patent Application Trends in 2025
- TOKYO ELECTRON LIMITED Patent Application Trends in 2024
- Tokyo Electron Limited Patent Application Trends in 2024
- TOKYO ELECTRON LIMITED Patent Application Trends in 2025
- Tokyo Electron Limited Patent Application Trends in 2025
- Tokyo Electron Limited patent applications on March 6th, 2025
- TSINGHUA UNIVERSITY Patent Application Trends in 2025
- Tsinghua University Patent Application Trends in 2025