Samsung electronics co., ltd. (20240201104). INSPECTION DEVICE simplified abstract
INSPECTION DEVICE
Organization Name
Inventor(s)
KENJI Suzuki of Yokohama-shi (JP)
Mitsunori Numata of Yokohama-shi (JP)
Shinji Ueyama of Yokohama-shi (JP)
Tomoki Onishi of Yokohama-shi (JP)
INSPECTION DEVICE - A simplified explanation of the abstract
This abstract first appeared for US patent application 20240201104 titled 'INSPECTION DEVICE
Simplified Explanation:
An inspection device is designed to enhance the accuracy characteristics of a Magnetic Random Access Memory (MRAM) element. The device includes a stage where the MRAM element is mounted, electromagnets that generate magnetic fields, and an optical system that illuminates the MRAM element with polarized light.
Key Features and Innovation:
- Inspection device for improving accuracy characteristics of MRAM elements
- Stage for mounting MRAM element
- Electromagnets generating magnetic fields
- Changeable magnetic fields based on position on the stage
- Optical system with polarized light for illuminating the MRAM element
- Detector for detecting reflected light when the position of the MRAM element is changed
Potential Applications: The technology can be used in the semiconductor industry for quality control and testing of MRAM elements.
Problems Solved: The device addresses the need for accurate inspection and testing of MRAM elements to ensure their functionality and reliability.
Benefits:
- Improved accuracy characteristics of MRAM elements
- Enhanced quality control in the semiconductor industry
- Increased reliability of MRAM devices
Commercial Applications: Potential commercial applications include semiconductor manufacturing companies, research institutions, and electronics companies looking to incorporate MRAM technology into their products.
Prior Art: Readers can explore prior art related to MRAM inspection devices in semiconductor manufacturing and quality control processes.
Frequently Updated Research: Stay updated on the latest advancements in MRAM technology and inspection devices to ensure optimal performance and accuracy.
Questions about MRAM Inspection Devices: 1. What are the key components of an MRAM inspection device? 2. How does the changeable magnetic field in the device improve accuracy characteristics?
Original Abstract Submitted
an inspection device improves accuracy characteristics of an (mram), the inspection device including a stage on which a mram element is fixed, and electromagnets generating a first magnetic field. a magnetic field having a component in a direction perpendicular to the stage is changeable from a first direction to a second direction according to a position on the stage. a second magnetic field in which a direction of a magnetic field component is parallel to the stage changes from a third direction to a fourth direction according to the position on the stage, an optical system illuminating the mram element with light including polarized light, and condensing reflected light from reflected illumination light from the mram element, and a detector detecting reflected light when the position of the mram element is changed, and when the position of the mram element in the second magnetic field is changed.
