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Category:G11C29/44
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Pages in category "G11C29/44"
The following 42 pages are in this category, out of 42 total.
1
- 17731994. SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17750581. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17807314. ENABLING OR DISABLING ON-DIE ERROR-CORRECTING CODE FOR A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17808043. INTERRUPTING A MEMORY BUILT-IN SELF-TEST simplified abstract (Micron Technology, Inc.)
- 17822032. SYSTEMS AND METHODS FOR TESTING REDUNDANT FUSE LATCHES IN A MEMORY DEVICE simplified abstract (Micron Technology, Inc.)
- 17944691. MEMORY REPAIR SYSTEM AND METHOD simplified abstract (QUALCOMM Incorporated)
- 18062843. MEMORY DEVICE FOR OUTPUTTING TEST RESULTS simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18068337. STORAGE DEVICES AND METHODS OF OPERATING STORAGE DEVICES simplified abstract (Samsung Electronics Co., Ltd.)
- 18091258. MEMORY AND METHOD WITH IN-MEMORY COMPUTING DEFECT DETECTION simplified abstract (Samsung Electronics Co., Ltd.)
- 18093560. MEMORY DEVICE AND MEMORY SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18149302. MEMORY DEVICE FOR COLUMN REPAIR simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18164100. MEMORY SYSTEMS HAVING MEMORY DEVICES THEREIN WITH ENHANCED ERROR CORRECTION CAPABILITY AND METHODS OF OPERATING SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18222563. MEMORY SYSTEM, OPERATING METHOD OF THE SAME, AND CONTROLLER OF MEMORY DEVICE simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18238096. TECHNOLOGIES FOR ALLOCATING RESOURCES ACROSS DATA CENTERS simplified abstract (Intel Corporation)
- 18296640. MEMORY DEVICE INCLUDING FLEXIBLE COLUMN REPAIR CIRCUIT simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18358587. MEMORY SYSTEM simplified abstract (SK hynix Inc.)
- 18374026. NON-VOLATILE MEMORY DEVICE, OPERATING METHOD THEREOF, CONTROLLER FOR CONTROLLING THE SAME, AND STORAGE DEVICE HAVING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18402647. METHOD AND MEMORY DEVICE WITH INCREASED READ AND WRITE MARGIN simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18455575. MEMORY SYSTEM HAVING A NON-VOLATILE MEMORY AND A CONTROLLER CONFIGURED TO SWITCH A MODE FOR CONTROLLING AN ACCESS OPERATION TO THE NON-VOLATILE MEMORY simplified abstract (Kioxia Corporation)
- 18475968. BUILT-IN-SELF-TEST LOGIC, MEMORY DEVICE WITH SAME, AND MEMORY MODULE TESTING METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18486789. CONDUCTING BUILT-IN SELF-TEST OF MEMORY MACRO simplified abstract (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.)
- 18512792. SYSTEMS AND METHODS TO DETECT CELL-INTERNAL DEFECTS simplified abstract (Taiwan Semiconductor Manufacturing Company, Ltd.)
- 18521382. WEIGHTED WEAR LEVELING FOR IMPROVING UNIFORMITY simplified abstract (Micron Technology, Inc.)
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- Micron technology, inc. (20240127901). TEMPERATURE-BASED ERROR MASKING DURING MBIST OPERATION simplified abstract
- Micron technology, inc. (20240127902). INDICATING A STATUS OF A MEMORY BUILT-IN SELF-TEST simplified abstract
- Micron Technology, Inc. patent applications on April 18th, 2024
- Micron Technology, Inc. patent applications on February 29th, 2024
- Micron Technology, Inc. patent applications on January 18th, 2024
- MICRON TECHNOLOGY, INC. patent applications on January 25th, 2024
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- Taiwan semiconductor manufacturing company, ltd. (20240136008). METHOD AND MEMORY DEVICE WITH INCREASED READ AND WRITE MARGIN simplified abstract
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on April 25th, 2024
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. patent applications on February 15th, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on March 14th, 2024
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- US Patent Application 18124733. METHODS FOR REAL-TIME REPAIRING OF MEMORY FAILURES CAUSED DURING OPERATIONS, MEMORY SYSTEMS PERFORMING REPAIRING METHODS, AND DATA PROCESSING SYSTEMS INCLUDING REPAIRING MEMORY SYSTEMS simplified abstract
- US Patent Application 18365868. MEMORY MODULE WITH REDUCED ECC OVERHEAD AND MEMORY SYSTEM simplified abstract