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Category:G01R31/26
Subcategories
This category has the following 60 subcategories, out of 60 total.
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Pages in category "G01R31/26"
The following 126 pages are in this category, out of 126 total.
1
- 17528340. USAGE METERING TO PREVENT IC COUNTERFEIT simplified abstract (International Business Machines Corporation)
- 17534629. Reliability Macros for Contact Over Active Gate Layout Designs simplified abstract (International Business Machines Corporation)
- 17816619. SEMICONDUCTOR PACKAGE AND METHOD OF TESTING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 17825087. COMPUTING DEVICES FOR PREDICTING ELECTRICAL TESTS, ELECTRICAL TEST PREDICTION APPARATUSES HAVING THE SAME, AND OPERATING METHODS THEREOF simplified abstract (Samsung Electronics Co., Ltd.)
- 17885071. Fast Transient Detection simplified abstract (Google LLC)
- 18093669. TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS simplified abstract (Samsung Display Co., Ltd.)
- 18119076. Semiconductor Device Testing with Lead Extender simplified abstract (Infineon Technologies AG)
- 18180101. TESTING APPARATUS simplified abstract (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 18237292. MEASUREMENT METHOD AND MEASUREMENT DEVICE simplified abstract (KABUSHIKI KAISHA TOSHIBA)
- 18244559. TRANSMITTING AND RECEIVING CIRCUIT AND TEST DEVICE INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18311772. TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF MANUFACTURING THE SAME AND METHOD OF DETERMINING AN EFFECTIVE WORK FUNCTION simplified abstract (SK hynix Inc.)
- 18319507. PROBE CARD AND CALIBRATION METHOD FOR PROBER simplified abstract (United Microelectronics Corp.)
- 18343763. ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURING CIRCUIT OPERATION (Intel Corporation)
- 18414413. SEMICONDUCTOR TESTING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract (Mitsubishi Electric Corporation)
- 18442662. SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR OVER TEMPERATURE simplified abstract (Texas Instruments Incorporated)
- 18442731. Arrangement For Monitoring the Condition of a Power Semiconductor Module of an Electric Drive Device simplified abstract (ABB Schweiz AG)
- 18443912. Computer-Implemented Method for Optimizing a Detection Threshold of a Prediction Model simplified abstract (Robert Bosch GmbH)
- 18454404. TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT simplified abstract (Samsung Electronics Co., Ltd.)
- 18454510. System and Methods for Detecting a Switching Semiconductor in Circuit Interrupters (ABB Schweiz AG)
- 18464481. CARRIER-RESOLVED HALL MEASUREMENT WITH MULTI-HARMONIC MAGNETORESISTANCE ANALYSIS (International Business Machines Corporation)
- 18468161. Systems and Methods for Calibrating a Wireless Harness Automated Measurement System (Lockheed Martin Corporation)
- 18486080. JOSEPHSON JUNCTION-BASED CHARGE SENSING IN QUANTUM SYSTEMS (THE BOEING COMPANY)
- 18487630. MONITOR STRUCTURES FOR MEASURING DEVICE IMPEDANCE (TEXAS INSTRUMENTS INCORPORATED)
- 18493656. POWER TRANSISTOR AGE DETECTION (Infineon Technologies Canada Inc.)
- 18497426. Switching Transient Based Junction Temperature Estimation of SiC MOSFETs with Aging Compensation (BOARD OF REGENTS, THE UNIVERSITY OF TEXAS SYSTEM)
- 18500841. APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT simplified abstract (SK hynix Inc.)
- 18502649. POWER DEVICE PROGNOSTICS WITH QUANTUM SENSING THROUGH 2-D MATERIALS (Toyota Jidosha Kabushiki Kaisha)
- 18502649. POWER DEVICE PROGNOSTICS WITH QUANTUM SENSING THROUGH 2-D MATERIALS (Toyota Motor Engineering & Manufacturing North America, Inc.)
- 18521585. Enclosure Detection for Reliable Optical Failsafe simplified abstract (Apple Inc.)
- 18538012. METHOD FOR PREDICTING FAILURE OF SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE simplified abstract (DENSO CORPORATION)
- 18556158. METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS simplified abstract (Robert Bosch GmbH)
- 18588421. SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME simplified abstract (Renesas Electronics Corporation)
- 18593163. METHOD AND DEVICE FOR INSPECTING JUNCTION PORTION OF POWER MODULE (HYUNDAI MOTOR COMPANY)
- 18593163. METHOD AND DEVICE FOR INSPECTING JUNCTION PORTION OF POWER MODULE (KIA CORPORATION)
- 18595526. SEMICONDUCTOR APPARATUS, IMAGE CAPTURING APPARATUS, IMAGE CAPTURING SYSTEM, AND MOVING OBJECT simplified abstract (CANON KABUSHIKI KAISHA)
- 18602638. SEMICONDUCTOR DEVICE AND OVERCURRENT PROTECTION DEVICE simplified abstract (FUJI ELECTRIC CO., LTD.)
- 18604951. DEGRADATIONS DETECTION FOR MOS-TRANSISTORS AND GATE-DRIVERS simplified abstract (Infineon Technologies AG)
- 18609105. SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD simplified abstract (Mitsubishi Electric Corporation)
- 18624608. LIGHT-EMITTING DEVICE simplified abstract (Innolux Corporation)
- 18659608. DISPLAY PANEL INSPECTION DEVICE EVALUATING LIGHT DETECTION CHARACTERISTICS (Samsung Display Co., LTD.)
- 18685064. Semiconductor Module Inspection Device (Nippon Telegraph and Telephone Corporation)
- 18710303. ARRANGEMENT AND METHOD FOR TESTING OPTOELECTRONIC COMPONENTS (ams-OSRAM International GmbH)
- 18808282. Method for Monitoring a Drive Device of an Electric Motor (Robert Bosch GmbH)
- 18808733. Method and Apparatus for Estimating Cyclic Thermal Stress (ABB Schweiz AG)
- 18819838. TEST CIRCUIT AND TESTING METHOD (FUJI ELECTRIC CO., LTD.)
- 18890330. LIGHT EMITTING DEVICE INCLUDING BASE AND BASE CAP (NICHIA CORPORATION)
- 18891071. SHORT-CIRCUIT DETECTION CIRCUIT FOR SEMICONDUCTOR SWITCH (DENSO CORPORATION)
- 18908105. TRANSISTOR ARRANGEMENT AND METHOD FOR MEASURING AN ON- RESISTANCE OF A TRANSISTOR ARRANGEMENT (Infineon Technologies AG)
- 18920172. SEMICONDUCTOR TEST APPARATUS (Samsung Electronics Co., Ltd.)
- 18958291. SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FAILURE OF BIPOLAR JUNCTION TRANSISTORS AND METHODS FOR DETECTING FAILURE OF THE BIPOLAR JUNCTION TRANSISTORS (Samsung Electronics Co., Ltd.)
- 18963490. SEMICONDUCTOR DEVICE (FUJI ELECTRIC CO., LTD.)
- 19017825. SYSTEM AND METHOD OF MEASURING CAPACITANCE OF DEVICE-UNDER-TEST (TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.)
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- Intel corporation (20250004035). ALGORITHM FOR ASSESSMENT OF FORWARD BIASED JUNCTIONS DETECTED DURING CIRCUIT OPERATION
- Intel Corporation patent applications on January 2nd, 2025
- International business machines corporation (20240426895). CONTACT RESISTANCE TEST STRUCTURE FOR STACKED FETS
- International business machines corporation (20250085331). CARRIER-RESOLVED HALL MEASUREMENT WITH MULTI-HARMONIC MAGNETORESISTANCE ANALYSIS
- International Business Machines Corporation patent applications on December 26th, 2024
- International Business Machines Corporation patent applications on March 13th, 2025
- International Business Machines Corporation patent applications on March 6th, 2025
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- Mitsubishi electric corporation (20240241169). INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE simplified abstract
- Mitsubishi electric corporation (20240255565). SERVICE LIFE DIAGNOSTIC DEVICE AND POWER CONVERSION DEVICE simplified abstract
- Mitsubishi electric corporation (20240295599). SEMICONDUCTOR TESTING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE simplified abstract
- Mitsubishi Electric Corporation patent applications on August 1st, 2024
- Mitsubishi Electric Corporation patent applications on July 18th, 2024
- Mitsubishi Electric Corporation patent applications on September 5th, 2024
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- Robert bosch gmbh (20240210465). METHOD FOR DETERMINING WEAR IN AN ELECTRONIC UNIT, AND TEST APPARATUS simplified abstract
- Robert bosch gmbh (20240241170). SEMICONDUCTOR SWITCH ASSEMBLY HAVING A MONITORING FUNCTION, ENERGY SYSTEM AND VEHICLE simplified abstract
- Robert bosch gmbh (20240280626). Computer-Implemented Method for Optimizing a Detection Threshold of a Prediction Model simplified abstract
- Robert bosch gmbh (20240426675). METHOD AND CIRCUIT ARRANGEMENTS FOR DETERMINING A BARRIER-LAYER TEMPERATURE OF A SEMICONDUCTOR COMPONENT HAVING AN INSULATED GATE
- Robert bosch gmbh (20250067790). Method for Monitoring a Drive Device of an Electric Motor
- Robert Bosch GmbH patent applications on August 22nd, 2024
- Robert Bosch GmbH patent applications on December 26th, 2024
- Robert Bosch GmbH patent applications on February 27th, 2025
- Robert Bosch GmbH patent applications on January 18th, 2024
- Robert Bosch GmbH patent applications on July 18th, 2024
- Robert Bosch GmbH patent applications on June 27th, 2024
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- Samsung display co., ltd. (20240102921). OPTICAL INSPECTION APPARATUS simplified abstract
- Samsung display co., ltd. (20250138077). DISPLAY PANEL INSPECTION DEVICE EVALUATING LIGHT DETECTION CHARACTERISTICS
- Samsung Display Co., Ltd. patent applications on March 28th, 2024
- Samsung Display Co., LTD. patent applications on May 1st, 2025
- Samsung electronics co., ltd. (20240125841). TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT simplified abstract
- Samsung electronics co., ltd. (20240255563). ELECTROLUMINESCENCE INSPECTION APPARATUS
- Samsung electronics co., ltd. (20240255563). ELECTROLUMINESCENCE INSPECTION APPARATUS simplified abstract
- Samsung electronics co., ltd. (20240255564). BONDING QUALITY TEST METHOD, BONDING QUALITY TEST CIRCUIT, AND MEMORY DEVICE INCLUDING BONDING QUALITY TEST CIRCUIT
- Samsung electronics co., ltd. (20240255564). BONDING QUALITY TEST METHOD, BONDING QUALITY TEST CIRCUIT, AND MEMORY DEVICE INCLUDING BONDING QUALITY TEST CIRCUIT simplified abstract
- Samsung electronics co., ltd. (20250085329). SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FAILURE OF BIPOLAR JUNCTION TRANSISTORS AND METHODS FOR DETECTING FAILURE OF THE BIPOLAR JUNCTION TRANSISTORS
- Samsung electronics co., ltd. (20250130268). SEMICONDUCTOR TEST APPARATUS
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on April 24th, 2025
- Samsung Electronics Co., Ltd. patent applications on August 1st, 2024
- Samsung Electronics Co., Ltd. patent applications on March 13th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 14th, 2024
- Sk hynix inc. (20240118332). TEST DEVICE FOR DETERMINING AN EFFECTIVE WORK FUNCTION, METHOD OF MANUFACTURING THE SAME AND METHOD OF DETERMINING AN EFFECTIVE WORK FUNCTION simplified abstract
- Sk hynix inc. (20240159818). APPARATUS AND METHOD OF MEASURING RELIABILITY FOR FLASH MEMORY MATERIAL THROUGH A CURRENT MEASUREMENT simplified abstract
- SK hynix Inc. patent applications on April 11th, 2024
- SK hynix Inc. patent applications on February 6th, 2025
- SK hynix Inc. patent applications on May 16th, 2024
- Stmicroelectronics international n.v. (20250004020). MONITORING CIRCUIT AND CORRESPONDING METHOD
- STMicroelectronics International N.V. patent applications on January 2nd, 2025
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- Taiwan semiconductor manufacturing company, ltd. (20250060404). GAN RELIABILITY BUILT-IN SELF TEST (BIST) APPARATUS AND METHOD FOR QUALIFYING DYNAMIC ON-STATE RESISTANCE DEGRADATION
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. patent applications on February 20th, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd. patent applications on February 8th, 2024
- Texas instruments incorporated (20240345154). INTEGRATED CIRCUIT DIE TEST ARCHITECTURE simplified abstract
- TEXAS INSTRUMENTS INCORPORATED patent applications on October 17th, 2024
- The boeing company (20250124321). JOSEPHSON JUNCTION-BASED CHARGE SENSING IN QUANTUM SYSTEMS
- THE BOEING COMPANY patent applications on April 17th, 2025
- Tokyo Electron Limited patent applications on March 6th, 2025