Apple inc. (20240402237). Electrical Testing for Panel Characterization and Defect Screening
Electrical Testing for Panel Characterization and Defect Screening
Organization Name
Inventor(s)
Xuebei Yang of Fremont CA (US)
Chung-Lun E Hsu of San Jose CA (US)
Cheuk Chi Lo of Belmont CA (US)
Hasan Akyol of Los Altos CA (US)
Yingkan Lin of San Jose CA (US)
John T Wetherell of San Jose CA (US)
Han Zhao of Santa Clara CA (US)
Electrical Testing for Panel Characterization and Defect Screening
This abstract first appeared for US patent application 20240402237 titled 'Electrical Testing for Panel Characterization and Defect Screening
Original Abstract Submitted
systems and methods are provided for electrical testing to supplement or replace optical testing of an electronic display. internal testing circuitry that includes analog front end (afe) and analog-to-digital converter (adc) circuitry may be included in the electronic display and may be used either alone or in combination with other testing devices to perform electrical characterization and defect screening. the electrical characterization and defect screening may be performed before or after self-emissive elements such as light-emitting diodes are installed, further improving yield. types of electrical characterization and defect screening may include a partial passive mode electrical characterization of oleds, vertical or horizontal crosstalk measurement, scan line integrity testing, pixel bright dot testing, display pixel defect detection, and delayed defect detection for defects that may occur after some extended period of time (e.g., after several minutes, after several hours).
