Samsung electronics co., ltd. (20250130268). SEMICONDUCTOR TEST APPARATUS
SEMICONDUCTOR TEST APPARATUS
Organization Name
Inventor(s)
Kiyoung Jeon of Seongnam-si KR
Kwanghwa Lee of Seongnam-si KR
Seokjae Hong of Seongnam-si KR
SEMICONDUCTOR TEST APPARATUS
This abstract first appeared for US patent application 20250130268 titled 'SEMICONDUCTOR TEST APPARATUS
Original Abstract Submitted
a semiconductor test apparatus includes a base plate, side supporters provided as three or more on a lower surface of the base plate, an elastic cylinder and a side stopper provided on a lower surface of each of the side supporters, a center stopper provided laterally apart from the side supporters on the lower surface of the base plate, a stopper foot provided at one end of the center stopper, a foot supporter provided at one end of the stopper foot, a top plate disposed under the base plate to contact the elastic cylinder and the side stopper, the top plate including a center hole in a center portion thereof, and a substrate cover provided under the top plate, wherein the center stopper and the side stopper are selectively locked.