ELECTROLUMINESCENCE INSPECTION APPARATUS

Organization Name

samsung electronics co., ltd.

Inventor(s)

Sungyong Min of Suwon-si KR

Changkyu Chung of Suwon-si KR

Kyungwoon Jang of Suwon-si KR

Daeseok Hwang of Suwon-si KR

ELECTROLUMINESCENCE INSPECTION APPARATUS

This abstract first appeared for US patent application 20240255563 titled 'ELECTROLUMINESCENCE INSPECTION APPARATUS

Original Abstract Submitted

an electroluminescence inspection apparatus includes a first substrate, and electrode members arranged at a first surface of the first substrate, and electrically contacted respectively with a chip electrode pad of light emitting diodes arranged at a second substrate based on performing an electroluminescence inspection, wherein an electrode member includes contact protrusions configured to be elastically contacted at a chip electrode member of the light emitting diode based on the first substrate is pressed by the second substrate.