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Category:G01N21/88
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Pages in category "G01N21/88"
The following 42 pages are in this category, out of 42 total.
1
- 17501318. INSPECTION SYSTEM OF SEMICONDUCTOR WAFER AND METHOD OF DRIVING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17737663. OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 17823806. MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING simplified abstract (Micron Technology, Inc.)
- 17881367. WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD OF INSPECTING WAFER USING THE SAME simplified abstract (Samsung Electronics Co., Ltd.)
- 17940308. INSPECTION SYSTEM INCLUDING SIDE ILLUMINATION UNIT AND INSPECTION METHOD USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18107648. INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18219494. SUBSTRATE INSPECTION METHOD simplified abstract (Samsung Electronics Co., Ltd.)
- 18220491. PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLUDING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18223616. LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)
- 18225222. METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND COMPUTER-READABLE STORAGE MEDIUM simplified abstract (CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED)
- 18275945. INSPECTION DEVICE AND INSPECTION METHOD simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
- 18300019. PRINTED-MATTER INSPECTION SYSTEM AND NON-TRANSITORY COMPUTER READABLE MEDIUM simplified abstract (FUJIFILM Business Innovation Corp.)
- 18317387. SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract (Samsung Electronics Co., Ltd.)
- 18483954. OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING METHOD simplified abstract (NEC Corporation)
A
- Apple inc. (20240102938). ARTIFACT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS simplified abstract
- Apple inc. (20240102939). LIGHT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS simplified abstract
- Apple inc. (20240104777). CAMERA-ALIGNMENT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS simplified abstract
- Apple Inc. patent applications on March 28th, 2024
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- Samsung display co., ltd. (20240094135). LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract
- Samsung display co., ltd. (20240102942). DEFECT ANALYSIS DEVICE AND DEFECT ANALYSIS METHOD USING THE SAME simplified abstract
- Samsung display co., ltd. (20240118217). PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLUDING THE SAME simplified abstract
- Samsung Display Co., Ltd. patent applications on April 11th, 2024
- SAMSUNG DISPLAY CO., LTD. patent applications on January 25th, 2024
- Samsung Display Co., Ltd. patent applications on March 21st, 2024
- Samsung Display Co., Ltd. patent applications on March 28th, 2024
- Samsung electronics co., ltd. (20240125709). SEMICONDUCTOR MEASUREMENT APPARATUS simplified abstract
- Samsung Electronics Co., Ltd. patent applications on April 18th, 2024
- Samsung Electronics Co., Ltd. patent applications on January 18th, 2024