US Patent Application 18126804. METHOD FOR DETECTING PRODUCT FOR DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM simplified abstract

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METHOD FOR DETECTING PRODUCT FOR DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM

Organization Name

HON HAI PRECISION INDUSTRY CO., LTD.

Inventor(s)

CHUNG-YU Wu of New Taipei (TW)

CHIN-PIN Kuo of New Taipei (TW)

METHOD FOR DETECTING PRODUCT FOR DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM - A simplified explanation of the abstract

This abstract first appeared for US patent application 18126804 titled 'METHOD FOR DETECTING PRODUCT FOR DEFECTS, ELECTRONIC DEVICE, AND STORAGE MEDIUM

Simplified Explanation

The patent application describes a method for detecting defects in a product using an electronic device.

  • The method involves obtaining an image of the product to be detected.
  • The image is then input into a pre-trained autoencoder to obtain a reconstructed image.
  • A difference image is generated by comparing the original image with the reconstructed image.
  • Clustering processing is performed on the difference image to obtain a number of feature absolute values.
  • A target image is generated based on the number of feature absolute values, the difference image, and a preset value.
  • The target image is then analyzed for defects to determine a defect detection result.


Original Abstract Submitted

A method for detecting a product for defects implemented in an electronic device, the method obtains an image of a product to be detected, obtains a reconstructed image by inputting the image to be detected into a pre-trained autoencoder, generates a difference image from the image and the reconstructed image, obtains a number of feature absolute values by performing clustering processing on the difference image; generates a target image according to the number of feature absolute values, the difference image, and a preset value; and determines a defect detection result by detecting the target image for defects.

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