17737663. OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)

OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME

Organization Name

Samsung Display Co., Ltd.

Inventor(s)

Jeong Moon Lee of Seoul (KR)

Dae Hong Kim of Seongnam-si (KR)

Hyung Jin Lee of Suwon-si (KR)

OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 17737663 titled 'OPTICAL INSPECTION DEVICE AND INSPECTING METHOD USING THE SAME

Simplified Explanation

The abstract describes an optical inspection device that includes a barrel, two light source units, and a camera. The first light source unit emits light of a specific wavelength range through a first light path, while the second light source unit emits light of a different wavelength range through a second light path. The first and second light paths are at least partially different from each other.

• The device consists of a barrel, two light source units, and a camera.
• The first light source unit emits light of a specific wavelength range through a first light path.
• The second light source unit emits light of a different wavelength range through a second light path.
• The first and second light paths are different from each other.

Potential Applications:

• Optical inspection and quality control in manufacturing processes.
• Non-destructive testing and inspection of materials.
• Medical imaging and diagnostics.
• Forensic analysis and evidence examination.

Problems Solved:

• Enables simultaneous inspection using different wavelengths of light.
• Provides flexibility in examining objects with varying optical properties.
• Enhances the accuracy and reliability of inspections by utilizing multiple light sources.

Benefits:

• Improved detection and identification of defects or abnormalities.
• Increased efficiency and speed in inspection processes.
• Enhanced versatility in adapting to different inspection requirements.
• Enables more comprehensive analysis and evaluation of objects or samples.

Original Abstract Submitted

An optical inspection device includes: a barrel; a first light source unit at a first side of the barrel and configured to irradiate light of a first wavelength range through a first light path; a second light source unit at a second side of the barrel, the second side being different from the first side, and configured to irradiate light of a second wavelength range that is different from the first wavelength range through a second light path; and a camera. At least a portion of the first light path is different from the second light path.