18223616. LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)

From WikiPatents
Jump to navigation Jump to search

LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME

Organization Name

Samsung Display Co., Ltd.

Inventor(s)

SEUNGMIN Song of Yongin-si (KR)

LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18223616 titled 'LASER INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME

Simplified Explanation

The patent application describes a laser inspection system with multiple laser units and an inspection object on a stage.

  • The system includes a stage with a top surface parallel to a defined plane.
  • A first laser unit emits a laser beam parallel to the plane.
  • A second laser unit emits a laser beam parallel to the first laser beam.
  • An inspection object on the stage has maximum and minimum allowable specifications in a perpendicular direction from the top surface.

Potential Applications

This technology could be used in industries such as manufacturing, quality control, and precision engineering for accurate and efficient inspection processes.

Problems Solved

This technology solves the problem of precise and reliable inspection of objects with specific dimensional requirements in a non-contact manner.

Benefits

The benefits of this technology include increased accuracy, speed, and automation in the inspection process, leading to improved product quality and reduced human error.

Potential Commercial Applications

"Advanced Laser Inspection System for Industrial Quality Control"

Possible Prior Art

Prior art may include existing laser inspection systems used in manufacturing and quality control processes.

Unanswered Questions

How does the system handle variations in the surface of the inspection object?

The abstract does not provide details on how the system compensates for irregularities in the surface of the inspection object.

What is the maximum distance between the laser units and the inspection object for accurate measurements?

The abstract does not specify the maximum allowable distance between the laser units and the inspection object for precise inspection results.


Original Abstract Submitted

A laser inspection system includes a stage including a top surface parallel to a plane defined by a first direction and a second direction intersecting the first direction, a first laser unit spaced apart from the stage in a third direction perpendicular to the plane, where the first laser unit emits a first laser beam proceeding in a direction parallel to the plane, a second laser unit spaced apart from the first laser unit in the third direction, where the second laser unit emits a second laser beam proceeding in a direction parallel to a proceeding direction of the first laser beam, and an inspection object spaced apart from the first laser unit in the first direction on the top surface of the stage, where the inspection object has a maximum allowable specification and a minimum allowable specification in the third direction from the top surface of the stage.