18107648. INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME simplified abstract (Samsung Display Co., Ltd.)

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INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME

Organization Name

Samsung Display Co., Ltd.

Inventor(s)

SUNGWOO Jung of Cheonan-si (KR)

HYEONSUK Guak of Suwon-si (KR)

JAEWOO Jung of Gwangmyeong-si (KR)

INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME - A simplified explanation of the abstract

This abstract first appeared for US patent application 18107648 titled 'INSPECTION SYSTEM AND INSPECTION METHOD USING THE SAME

Simplified Explanation

The patent application describes an inspection system that uses polarization components to capture images of an inspection object. The system includes a light source, a main lens, a beam splitter, polarizers, and an image sensor.

  • The light source emits light that is directed towards the inspection object.
  • The main lens captures the reflected light from the inspection object, which includes both a first polarization component and a second polarization component.
  • The beam splitter splits the reflected light into two separate beams.
  • The first polarizer selectively allows the first polarization component to pass through, while blocking the second polarization component.
  • The second polarizer selectively allows the second polarization component to pass through, while blocking the first polarization component.
  • The image sensor captures two separate images: one for the first polarization component and one for the second polarization component.

Potential applications of this technology:

  • Quality control and inspection in manufacturing processes.
  • Non-destructive testing in industries such as automotive, aerospace, and electronics.
  • Medical imaging for detecting abnormalities or analyzing tissue properties.

Problems solved by this technology:

  • The system allows for the capture of separate images for different polarization components, providing more detailed information about the inspection object.
  • It enables the detection of defects or anomalies that may not be visible in traditional imaging techniques.
  • The system improves the accuracy and reliability of inspections by utilizing polarization properties.

Benefits of this technology:

  • Enhanced image analysis capabilities by capturing multiple polarization components.
  • Improved detection and characterization of defects or abnormalities.
  • Increased efficiency and accuracy in inspection processes.


Original Abstract Submitted

An inspection system includes: a single light source part which irradiates an incident light to an inspection object; a main lens through which reflected light, reflected from an inspection object and including a first polarization component and a second polarization component, passes; a beam splitter which splits a reflected light passing through a main lens into a first split light and a second split light; a first polarizer including a first filter area which selectively passes a first polarization component therethrough; a second polarizer including a second filter area which selectively passes a second polarization component therethrough; and an image sensor which generates a first captured image for a first polarization component and a second captured image for a second polarization component.

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