18275945. INSPECTION DEVICE AND INSPECTION METHOD simplified abstract (Panasonic Intellectual Property Management Co., Ltd.)
Contents
- 1 INSPECTION DEVICE AND INSPECTION METHOD
- 1.1 Organization Name
- 1.2 Inventor(s)
- 1.3 INSPECTION DEVICE AND INSPECTION METHOD - A simplified explanation of the abstract
- 1.4 Simplified Explanation
- 1.5 Potential Applications
- 1.6 Problems Solved
- 1.7 Benefits
- 1.8 Potential Commercial Applications
- 1.9 Possible Prior Art
- 1.10 Unanswered Questions
- 1.11 Original Abstract Submitted
INSPECTION DEVICE AND INSPECTION METHOD
Organization Name
Panasonic Intellectual Property Management Co., Ltd.
Inventor(s)
Ryosuke Shigitani of Osaka (JP)
INSPECTION DEVICE AND INSPECTION METHOD - A simplified explanation of the abstract
This abstract first appeared for US patent application 18275945 titled 'INSPECTION DEVICE AND INSPECTION METHOD
Simplified Explanation
The inspection device described in the abstract includes a light source with a phosphor and a photodetector to detect reflected light from an inspection object. The spectral distribution of the inspection light has at least one maximum value derived from fluorescence emitted by the phosphor, with the maximum value falling within a wavelength range of 600 nm to 750 nm. The device ensures that the spectral intensity at the maximum value is the largest, with the spectral intensity in longer wavelengths being at least 20% of the maximum value but less than the maximum value, and the spectral intensity in a range of 500 nm to 550 nm being less than 20% of the maximum value.
- Light source with phosphor
- Photodetector for detecting reflected light
- Spectral distribution with maximum value in 600-750 nm range
- Maximum spectral intensity at the maximum value
- Specific spectral intensity requirements in different wavelength ranges
Potential Applications
This technology can be applied in various fields such as:
- Non-destructive testing
- Quality control in manufacturing
- Medical imaging
Problems Solved
This technology addresses the following issues:
- Accurate detection of reflected light
- Enhanced spectral distribution analysis
- Improved inspection accuracy
Benefits
The benefits of this technology include:
- Higher precision in inspection processes
- Increased efficiency in detecting fluorescence
- Enhanced reliability in inspection results
Potential Commercial Applications
The potential commercial applications of this technology are:
- Industrial inspection equipment
- Medical diagnostic devices
- Scientific research instruments
Possible Prior Art
One possible prior art for this technology could be the use of phosphors in light sources for fluorescence detection.
Unanswered Questions
How does this technology compare to existing inspection devices in terms of accuracy and efficiency?
This article does not provide a direct comparison with existing inspection devices to evaluate its performance against them.
What are the specific industries or sectors that would benefit the most from this technology?
The article does not specify the industries or sectors where this technology would have the most significant impact.
Original Abstract Submitted
Provided is an inspection device including: a light source including a phosphor; and a photodetector, and detecting, using the photodetector, reflected light of the inspection light reflected by the inspection object. A spectral distribution of the inspection light has at least one maximum value derived from fluorescence emitted by the phosphor, and the maximum value is within a wavelength range of 600 nm or more and 750 nm or less. When Pmax is set as a spectral intensity at the maximum value where the spectral intensity is largest at the at least one maximum value, a largest value of the spectral intensity in a wavelength range longer than 750 nm is 20% or more of Pmax and less than Pmax, and the spectral intensity within a wavelength range of 500 nm or more and 550 nm or less is less than 20% of Pmax.
