18225222. METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND COMPUTER-READABLE STORAGE MEDIUM simplified abstract (CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED)
Contents
METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND COMPUTER-READABLE STORAGE MEDIUM
Organization Name
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Inventor(s)
METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND COMPUTER-READABLE STORAGE MEDIUM - A simplified explanation of the abstract
This abstract first appeared for US patent application 18225222 titled 'METHOD AND DEVICE FOR DETECTING DEFECT OF ELECTRODE ASSEMBLY, AND COMPUTER-READABLE STORAGE MEDIUM
Simplified Explanation
The abstract describes a method and device for detecting a defect in an electrode assembly, involving determining segmented images of the electrode assembly body and tab to assess the defect status.
- Method for detecting defects in an electrode assembly:
* Determine a first segmented image of the electrode assembly body based on a preset threshold. * Determine a second segmented image of the tab in the electrode assembly image based on a lower preset threshold. * Assess the defect status of the electrode assembly based on the segmented images.
- Potential Applications of this Technology:**
This technology can be applied in industries where electrode assemblies are used, such as in battery manufacturing, electronic devices, and automotive applications.
- Problems Solved by this Technology:**
This technology helps in identifying defects in electrode assemblies early on, which can prevent malfunctions, improve product quality, and reduce safety risks.
- Benefits of this Technology:**
- Early detection of defects - Improved product quality - Enhanced safety in applications using electrode assemblies
- Potential Commercial Applications of this Technology:**
- Enhancing Quality Control in Electrode Assembly Manufacturing*
- Possible Prior Art:**
There may be prior art related to image processing techniques for defect detection in manufacturing processes, but specific information on prior art related to this exact method and device is not provided in the abstract.
- Unanswered Questions:**
1. How does the method determine the first and second preset thresholds for segmenting the images?
*Answer:* The abstract does not provide details on how the preset thresholds are determined for segmenting the images of the electrode assembly.
2. Are there any specific types of defects that this method is particularly effective at detecting in electrode assemblies?
*Answer:* The abstract does not specify the types of defects that this method is optimized to detect in electrode assemblies.
Original Abstract Submitted
An embodiment of this application discloses a method and device for detecting a defect of an electrode assembly, and a computer-readable storage medium. The method may include: determining a first segmented image of an electrode assembly body in an electrode assembly image based on a first preset threshold; determining a second segmented image of a tab in the electrode assembly image based on a second preset threshold, where the second preset threshold is less than the first preset threshold; and determining defect status of the electrode assembly based on the first segmented image and the second segmented image.
