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Category:H01J37/244
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This category has the following 31 subcategories, out of 31 total.
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Pages in category "H01J37/244"
The following 38 pages are in this category, out of 38 total.
1
- 17879515. METHOD OF OPERATING SCANNING ELECTRON MICROSCOPE (SEM) AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18091041. XRAY DIFFRACTION ANGLE VERIFICATION IN AN ION IMPLANTER simplified abstract (Applied Materials, Inc.)
- 18101260. Dose Cup Assembly for an Ion Implanter simplified abstract (Applied Materials, Inc.)
- 18366322. APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18387987. XRAY DIFFRACTION ANGLE VERIFICATION IN AN ION IMPLANTER simplified abstract (Applied Materials, Inc.)
- 18499141. SEMICONDUCTOR DETECTOR AND METHOD OF FABRICATING SAME simplified abstract (ASML NETHERLANDS B.V.)
- 18584633. SENSOR DEVICE AND SYSTEM USING THE SAME (SAMSUNG ELECTRONICS CO., LTD.)
- 18600212. ELECTRON BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH)
- 18600313. PARTICLE BEAM MICROSCOPE simplified abstract (Carl Zeiss Microscopy GmbH)
- 18743011. CHARGED-PARTICLE OPTICAL APPARATUS AND PROJECTION METHOD simplified abstract (ASML Netherlands B.V.)
- 18743049. DETECTOR INSPECTION DEVICE, DETECTOR ASSEMBLY, DETECTOR ARRAY, APPARATUS, AND METHOD simplified abstract (ASML Netherlands B.V.)
- 18744367. METHOD OF GENERATING A SAMPLE MAP, COMPUTER PROGRAM PRODUCT, CHARGED PARTICLE INSPECTION SYSTEM, METHOD OF PROCESSING A SAMPLE, ASSESSMENT METHOD simplified abstract (ASML Netherlands B.V.)
- 18748758. CHARGED PARTICLE DEVICE, CHARGED PARTICLE ASSESSMENT APPARATUS, MEASURING METHOD, AND MONITORING METHOD simplified abstract (ASML Netherlands B.V.)
- 18791075. CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF (Kioxia Corporation)
- 18794582. CONOSCOPIC WAFER ORIENTATION FOR ION IMPLANTATION (Applied Materials, Inc.)
- 18794728. CONOSCOPIC WAFER ORIENTATION APPARATUS AND ION IMPLANTER INCLUDING SAME (Applied Materials, Inc.)
- 18835838. Ion Milling Device, and Inspection System (HITACHI HIGH-TECH CORPORATION)
- 18979967. METHOD OF ASSESSING A SAMPLE, APPARATUS FOR ASSESSING A SAMPLE (ASML Netherlands B.V.)
- 18989787. SEMICONDUCTOR STRUCTURE WITH CONDUCTIVE RINGS (Taiwan Semiconductor Manufacturing Co., Ltd.)
- 19010300. X-RAY IMAGING SYSTEM FOR RADIATION THERAPY (Shanghai United Imaging Healthcare Co., Ltd.)
A
- Applied materials, inc. (20240249908). Dose Cup Assembly for an Ion Implanter simplified abstract
- Applied materials, inc. (20250095952). CONOSCOPIC WAFER ORIENTATION APPARATUS AND ION IMPLANTER INCLUDING SAME
- Applied materials, inc. (20250095958). CONOSCOPIC WAFER ORIENTATION FOR ION IMPLANTATION
- Applied Materials, Inc. patent applications on February 13th, 2025
- Applied Materials, Inc. patent applications on February 20th, 2025
- Applied Materials, Inc. patent applications on July 25th, 2024
- Applied Materials, Inc. patent applications on March 20th, 2025
S
- Samsung electronics co., ltd. (20240203688). APPARATUS AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPE SUPPORTED BY ELECTRON DIFFRACTION PATTERN simplified abstract
- Samsung electronics co., ltd. (20250069846). SENSOR DEVICE AND SYSTEM USING THE SAME
- Samsung Electronics Co., Ltd. patent applications on February 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 27th, 2025
- Samsung Electronics Co., Ltd. patent applications on June 20th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on June 20th, 2024
T
- Taiwan semiconductor manufacturing co., ltd. (20250126929). SEMICONDUCTOR STRUCTURE WITH CONDUCTIVE RINGS
- Taiwan Semiconductor Manufacturing Co., Ltd. patent applications on April 17th, 2025
- Taiwan semiconductor manufacturing company, ltd. (20240290588). ION COLLECTOR FOR USE IN PLASMA SYSTEMS simplified abstract
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. patent applications on August 29th, 2024