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Category:G01R31/319
Subcategories
This category has the following 23 subcategories, out of 23 total.
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Pages in category "G01R31/319"
The following 57 pages are in this category, out of 57 total.
1
- 17550157. INTEGRATED CIRCUIT CHIP HAVING BACK-SURFACE TOPOGRAPHY FOR ENHANCED COOLING DURING CHIP TESTING simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
- 17944691. MEMORY REPAIR SYSTEM AND METHOD simplified abstract (QUALCOMM Incorporated)
- 18105792. SYSTEMS AND METHODS OF TESTING DEVICES USING CXL FOR INCREASED PARALLELISM simplified abstract (ADVANTEST CORPORATION)
- 18179593. HIGH THROUGHPUT SORT simplified abstract (Infineon Technologies AG)
- 18220879. DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract (Samsung Display Co., LTD.)
- 18272432. SELF-DIAGNOSIS CIRCUIT AND SEMICONDUCTOR DEVICE simplified abstract (Rohm Co., Ltd.)
- 18299265. WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18317100. TESTING DEVICE AND TESTING METHOD THEREOF simplified abstract (Winbond Electronics Corp.)
- 18374198. METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS USING A PORTABLE STORAGE DEVICE (INTEL CORPORATION)
- 18474511. TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS (STMicroelectronics International N.V.)
- 18475047. TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN (Advanced Micro Devices, Inc.)
- 18477128. FAULT DETECTION CIRCUIT (TEXAS INSTRUMENTS INCORPORATED)
- 18592221. TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME simplified abstract (SAMSUNG ELECTRONICS CO., LTD.)
- 18597215. HOLD TIME IMPROVED LOW AREA FLIP-FLOP ARCHITECTURE simplified abstract (Texas Instruments Incorporated)
- 18676787. DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION simplified abstract (Texas Instruments Incorporated)
- 18939673. MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPERATING METHOD OF MONITORING CIRCUIT (SAMSUNG ELECTRONICS CO., LTD.)
- 18956642. INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM (Tokyo Electron Limited)
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- Intel corporation (20240103077). METHOD AND APPARATUS FOR ACCESSING REMOTE TEST DATA REGISTERS simplified abstract
- Intel corporation (20240402251). MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL CIRCUITS
- Intel corporation (20250110175). METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS USING A PORTABLE STORAGE DEVICE
- Intel Corporation patent applications on April 3rd, 2025
- INTEL CORPORATION patent applications on April 3rd, 2025
- Intel Corporation patent applications on December 5th, 2024
- Intel Corporation patent applications on March 28th, 2024
- International business machines corporation (20240329137). STORAGE TESTING DEVICE FOR TESTING A STORAGE SYSTEM simplified abstract
- International Business Machines Corporation patent applications on March 6th, 2025
- International Business Machines Corporation patent applications on October 3rd, 2024
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- Samsung display co., ltd. (20240175907). DEFECT EVALUATION METHOD FOR EVALUATING DEFECT DUE TO ELECTROSTATIC DISCHARGE AND DEFECT EVALUATION DEVICE PERFORMING THE SAME simplified abstract
- Samsung Display Co., LTD. patent applications on May 30th, 2024
- Samsung electronics co., ltd. (20240310439). TEST DEVICE AND TEST METHOD IMPLEMENTING THE SAME simplified abstract
- Samsung electronics co., ltd. (20250067805). MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPERATING METHOD OF MONITORING CIRCUIT
- Samsung electronics co., ltd. (20250076377). BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME
- Samsung electronics co., ltd. (20250076381). RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF
- Samsung Electronics Co., Ltd. patent applications on February 27th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on February 27th, 2025
- Samsung Electronics Co., Ltd. patent applications on February 6th, 2025
- SAMSUNG ELECTRONICS CO., LTD. patent applications on March 14th, 2024
- Samsung Electronics Co., Ltd. patent applications on March 6th, 2025
- Samsung Electronics Co., Ltd. patent applications on September 19th, 2024
- SAMSUNG ELECTRONICS CO., LTD. patent applications on September 19th, 2024
- Stmicroelectronics international n.v. (20250102574). TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS
- STMicroelectronics International N.V. patent applications on March 27th, 2025
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- Taiwan semiconductor manufacturing company, ltd. (20240345146). Integrated Impedance Measurement Device and Impedance Measurement Method Thereof simplified abstract
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. patent applications on October 17th, 2024
- Texas instruments incorporated (20240310440). DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION simplified abstract
- Texas instruments incorporated (20250110176). FAULT DETECTION CIRCUIT
- TEXAS INSTRUMENTS INCORPORATED patent applications on April 3rd, 2025
- Texas Instruments Incorporated patent applications on September 19th, 2024