18477128. FAULT DETECTION CIRCUIT (TEXAS INSTRUMENTS INCORPORATED)

FAULT DETECTION CIRCUIT

Organization Name

TEXAS INSTRUMENTS INCORPORATED

Inventor(s)

Weibing Jing of Beijing CN

FAULT DETECTION CIRCUIT

This abstract first appeared for US patent application 18477128 titled 'FAULT DETECTION CIRCUIT

Original Abstract Submitted

Fault detection circuits and methods. An example of a fault detection circuit includes a comparator configured to compare a voltage at a voltage terminal with a reference voltage, a digital logic circuit coupled to a test terminal and configured to receive, responsive to the voltage at the voltage terminal being less than the reference voltage as indicated by the comparator, a test signal, the digital logic circuit including at least one digital logic gate, and an edge detection circuit configured to (a) monitor a signal produced at an output of the at least one digital logic gate, and (b) based on the signal failing to transgress a threshold within a time period, providing a fault signal indicating detection of a fault at the test terminal.