18475047. TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN (Advanced Micro Devices, Inc.)
TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN
Organization Name
Inventor(s)
Nehal Patel of Santa Clara CA US
TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN
This abstract first appeared for US patent application 18475047 titled 'TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN
Original Abstract Submitted
A disclosed technique includes based on a clock pattern, determining an enable configuration for setting enable signals for one or more multi-cycle paths of a hardware logic network; controlling a selector to set the enable configuration for the one or more multi-cycle paths; and executing testing operations for the hardware logic network with the one or more multi-cycle paths enabled according to the enable configuration.
