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Texas instruments incorporated (20250110176). FAULT DETECTION CIRCUIT
[[Category:G01R31/319]] [[Category:G01R31/317]] ...

1 KB (191 words) - 17:58, 3 April 2025
18477128. FAULT DETECTION CIRCUIT (TEXAS INSTRUMENTS INCORPORATED)
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1 KB (191 words) - 15:53, 4 April 2025
Samsung electronics co., ltd. (20250076377). BUILT-IN SELF-TEST CIRCUIT AND TEMPERATURE MEASUREMENT CIRCUIT INCLUDING THE SAME
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2 KB (321 words) - 02:04, 17 March 2025
Intel corporation (20250110175). METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS USING A PORTABLE STORAGE DEVICE
[[Category:G01R31/319]] [[Category:G01R31/28]] ...

2 KB (271 words) - 16:10, 3 April 2025
18374198. METHOD AND APPARATUS TO DETECT COMPUTING SYSTEM HARDWARE DEFECTS USING A PORTABLE STORAGE DEVICE (INTEL CORPORATION)
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2 KB (271 words) - 15:28, 4 April 2025
US Patent Application 18303401. Built-in Self-Test for Die-to-Die Physical Interfaces simplified abstract
[[Category:G01R31/3177]] [[Category:G01R31/317]] ...

3 KB (404 words) - 15:42, 3 December 2023
18956642. INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM (Tokyo Electron Limited)
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1 KB (167 words) - 04:32, 15 March 2025
18475047. TESTING MULTI-CYCLE PATHS BASED ON CLOCK PATTERN (Advanced Micro Devices, Inc.)
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1 KB (149 words) - 05:43, 31 March 2025
Stmicroelectronics international n.v. (20250102574). TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS
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2 KB (246 words) - 04:02, 31 March 2025
18474511. TEST TIME REDUCTION IN CIRCUITS WITH REDUNDANCY FLIP-FLOPS (STMicroelectronics International N.V.)
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2 KB (246 words) - 05:16, 31 March 2025
Samsung electronics co., ltd. (20250067805). MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPERATING METHOD OF MONITORING CIRCUIT
[[Category:G01R31/319]] [[Category:G01R31/30]] ...

2 KB (265 words) - 06:54, 17 March 2025
18939673. MONITORING CIRCUIT, INTEGRATED CIRCUIT INCLUDING THE SAME, AND OPERATING METHOD OF MONITORING CIRCUIT (SAMSUNG ELECTRONICS CO., LTD.)
[[Category:G01R31/319]] [[Category:G01R31/30]] ...

2 KB (265 words) - 09:19, 17 March 2025
Nvidia corporation (20240402250). FAULT DETECTION IN PARALLEL HARDWARE
[[Category:G01R31/3187]] [[Category:G01R31/319]] ...

2 KB (297 words) - 15:47, 11 December 2024
Samsung electronics co., ltd. (20250076381). RECEIVING CIRCUIT IN TEST DEVICE, TEST SYSTEM HAVING THE SAME, AND OPERATING METHOD THEREOF
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2 KB (299 words) - 02:04, 17 March 2025
17550157. INTEGRATED CIRCUIT CHIP HAVING BACK-SURFACE TOPOGRAPHY FOR ENHANCED COOLING DURING CHIP TESTING simplified abstract (INTERNATIONAL BUSINESS MACHINES CORPORATION)
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2 KB (357 words) - 09:34, 4 January 2024
Intel corporation (20240402251). MIXED SIGNAL CIRCUIT, METHODS AND DEVICES FOR TESTING MIXED SIGNAL CIRCUITS
[[Category:G01R31/319]] [[Category:G01R31/3193]] ...

2 KB (328 words) - 15:47, 11 December 2024
Texas instruments incorporated (20240310440). DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION simplified abstract
[[Category:G01R31/319]] [[Category:G01R31/3167]] ...

3 KB (489 words) - 09:00, 19 September 2024
18317100. TESTING DEVICE AND TESTING METHOD THEREOF simplified abstract (Winbond Electronics Corp.)
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3 KB (438 words) - 08:15, 19 September 2024
18676787. DEVICE UNDER TEST (DUT) MEASUREMENT CIRCUIT HAVING HARMONIC MINIMIZATION simplified abstract (Texas Instruments Incorporated)
[[Category:G01R31/319]] [[Category:G01R31/3167]] ...

4 KB (548 words) - 03:57, 1 October 2024
18179593. HIGH THROUGHPUT SORT simplified abstract (Infineon Technologies AG)
[[Category:G01R31/317]] [[Category:G01R31/3185]] ...

4 KB (490 words) - 07:36, 19 September 2024

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